• 1509 Citations
  • 18 h-Index
1988 …2017
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Research Output 1988 2017

  • 1509 Citations
  • 18 h-Index
  • 68 Article
  • 25 Conference contribution
  • 1 Chapter

An atomistic assessment of the impact of flaw orientation on the elastic and failure behavior of single-crystal Si nanometre-thick slabs

Huang, W. J., Bringuier, S., Paul, J., Simmons-Potter, K., Muralidharan, K. & Potter, B. G., Sep 22 2017, In : Philosophical Magazine. 97, 27, p. 2425-2436 12 p.

Research output: Contribution to journalArticle

slabs
single crystals
defects
embedded atom method
crack propagation

Comparison of efficiency degradation in polycrystalline-Si and CdTe thin-film PV modules via accelerated lifecycle testing

Lai, T., Potter, B. G. & Simmons-Potter, K., Jan 1 2017, Reliability of Photovoltaic Cells, Modules, Components, and Systems X. SPIE, Vol. 10370, 103700J

Research output: Chapter in Book/Report/Conference proceedingConference contribution

CdTe
Life Cycle
Thin Films
Degradation
modules

Data acquisition and PV module power production in upgraded TEP/AzRISE solar test yard

Bennett, W. E., Fishgold, A. D., Lai, T., Potter, B. G. & Simmons-Potter, K., Jan 1 2017, Reliability of Photovoltaic Cells, Modules, Components, and Systems X. SPIE, Vol. 10370, 103700G

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Solar Energy
solar energy
electric power
Data Acquisition
Solar energy
2 Citations

Electrocoagulation driven fabrication of graphene oxide films

Weisbart, C., Raghavan, S., Muralidharan, K. & Potter, B. G., May 1 2017, In : Carbon. 116, p. 318-324 7 p.

Research output: Contribution to journalArticle

Graphite
Oxide films
Fabrication
Copper
Anodes

Image analysis of PV module electroluminescence

Lai, T., Ramirez, C., Potter, B. G. & Simmons-Potter, K., Jan 1 2017, Reliability of Photovoltaic Cells, Modules, Components, and Systems X. SPIE, Vol. 10370, 103700K

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electroluminescence
image analysis
Image Analysis
electroluminescence
Image analysis