Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 5 Similar Profiles
illumination Physics & Astronomy
Imaging techniques Engineering & Materials Science
Fluorescence Engineering & Materials Science
lenses Physics & Astronomy
fluorescence Physics & Astronomy
optics Physics & Astronomy
polarization Physics & Astronomy
Imaging systems Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 2000 2017

  • 305 Citations
  • 10 h-Index
  • 68 Article
  • 27 Conference contribution
  • 1 Book
  • 1 Letter
1 Citations

Algorithm for designing free-form imaging optics with nonrational B-spline surfaces

Wu, R., Sasián, J. & Liang, R. Mar 20 2017 In : Applied Optics. 56, 9, p. 2517-2522 6 p.

Research output: Research - peer-reviewArticle

splines
optics
systems engineering
Newton methods
ray tracing

Analysis of spurious diffraction orders of computer-generated hologram in symmetric aspheric metrology

He, Y., Hou, X., Wu, F., Ma, X. & Liang, R. Aug 21 2017 In : Optics Express. 25, 17, p. 20556-20572 17 p.

Research output: Research - peer-reviewArticle

metrology
diffraction
aberration
pupils
rays
1 Citations

Compact polarization-based dual-view panoramic lens

Luo, Y., Huang, X., Bai, J. & Liang, R. Aug 1 2017 In : Applied Optics. 56, 22, p. 6283-6287 5 p.

Research output: Research - peer-reviewArticle

lenses
polarization
aerospace environments
sensors

Data processing for point-based in situ metrology of freeform optical surface

Zhang, Y., Cheng, H. N., Wu, R. & Liang, R. Jun 12 2017 In : Optics Express. 25, 12, p. 13414-13424 11 p.

Research output: Research - peer-reviewArticle

metrology
adjusting
newton
simulation

Fast searching measurement of absolute displacement based on submicron-aperture fiber point-diffraction interferometer

Wang, D., Wang, Z., Liang, R., Kong, M., Zhao, J., Zhao, J., Mo, L. & Li, W. 2017 Optical Measurement Systems for Industrial Inspection X. SPIE, Vol. 10329, 1032937

Research output: ResearchConference contribution

Interferometer
Diffraction
Fiber
interferometers
apertures