8.1: Experimental verification of a λ/50 optical spot size of a C-aperture nano antenna tip for photo-electron emitter applications

Yuzuru Takashima, Yao Te Cheng, Paul Hansen, Yin Yuen, Lambtertus Hesselink, Roger F. Pease, Juan R. Maldonado, Piero A. Pianetta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We propose a photo-electron emitter structure whose electron beam size is 20nm using CsBr photo-emission layer and a novel nano-optical antenna structure. The optical spot size of 20nm has been experimentally demonstrated.

Original languageEnglish (US)
Title of host publication23rd International Vacuum Nanoelectronics Conference, IVNC 2010
Pages113-114
Number of pages2
DOIs
StatePublished - 2010
Externally publishedYes
Event23rd International Vacuum Nanoelectronics Conference, IVNC 2010 - Palo Alto, CA, United States
Duration: Jul 26 2010Jul 30 2010

Other

Other23rd International Vacuum Nanoelectronics Conference, IVNC 2010
CountryUnited States
CityPalo Alto, CA
Period7/26/107/30/10

Fingerprint

Electron beams
Antennas
Electrons
Nanoantennas

Keywords

  • Nano optical antenna
  • Photo electron source

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Takashima, Y., Cheng, Y. T., Hansen, P., Yuen, Y., Hesselink, L., Pease, R. F., ... Pianetta, P. A. (2010). 8.1: Experimental verification of a λ/50 optical spot size of a C-aperture nano antenna tip for photo-electron emitter applications. In 23rd International Vacuum Nanoelectronics Conference, IVNC 2010 (pp. 113-114). [5563198] https://doi.org/10.1109/IVNC.2010.5563198

8.1 : Experimental verification of a λ/50 optical spot size of a C-aperture nano antenna tip for photo-electron emitter applications. / Takashima, Yuzuru; Cheng, Yao Te; Hansen, Paul; Yuen, Yin; Hesselink, Lambtertus; Pease, Roger F.; Maldonado, Juan R.; Pianetta, Piero A.

23rd International Vacuum Nanoelectronics Conference, IVNC 2010. 2010. p. 113-114 5563198.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Takashima, Y, Cheng, YT, Hansen, P, Yuen, Y, Hesselink, L, Pease, RF, Maldonado, JR & Pianetta, PA 2010, 8.1: Experimental verification of a λ/50 optical spot size of a C-aperture nano antenna tip for photo-electron emitter applications. in 23rd International Vacuum Nanoelectronics Conference, IVNC 2010., 5563198, pp. 113-114, 23rd International Vacuum Nanoelectronics Conference, IVNC 2010, Palo Alto, CA, United States, 7/26/10. https://doi.org/10.1109/IVNC.2010.5563198
Takashima Y, Cheng YT, Hansen P, Yuen Y, Hesselink L, Pease RF et al. 8.1: Experimental verification of a λ/50 optical spot size of a C-aperture nano antenna tip for photo-electron emitter applications. In 23rd International Vacuum Nanoelectronics Conference, IVNC 2010. 2010. p. 113-114. 5563198 https://doi.org/10.1109/IVNC.2010.5563198
Takashima, Yuzuru ; Cheng, Yao Te ; Hansen, Paul ; Yuen, Yin ; Hesselink, Lambtertus ; Pease, Roger F. ; Maldonado, Juan R. ; Pianetta, Piero A. / 8.1 : Experimental verification of a λ/50 optical spot size of a C-aperture nano antenna tip for photo-electron emitter applications. 23rd International Vacuum Nanoelectronics Conference, IVNC 2010. 2010. pp. 113-114
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