TY - JOUR
T1 - A comparison of CCD and CID detection for atomic emission spectroscopy
AU - Sweedler, Jonathan V.
AU - Jalkian, Rafi D.
AU - Pomeroy, Robert S.
AU - Denton, M. Bonner
N1 - Funding Information:
Acknowledgements-Thea uthors gratefullya cknowledget he work of Dr ROBISRBTI LHORNo f Eastman Kodak, Dr PATRICKE PPERSOoNf LawrenceL ivermoreN ational LaboratoriesD, r GARY SIMSo f PhotometricsL, td and CHAD E. CHEUK of the Universityo f Maryland.T his work has beenp artiallyf undedb y the Office of Naval ResearchS,m ithKlineB eckmanT, herm0J arrell Ash, andt heA nalyticaTl echnologieDs ivisiono f EastmanK odak. The supporto f an AnalyticalD ivision of the AmericanC hemicalS ocietyS ummerF ellowships ponsoredb y the Societyo f the AnalyticalC hemistso f Pittsburghi s gratefullya cknowledged.
PY - 1989
Y1 - 1989
N2 - The performances of two classes of charge transfer device detectors-the charge-coupled device and the charge injection device-are compared for atomic emission spectroscopy. For these studies, a direct current plasma source is employed with an echelle spectrograph having a spectral image size matched to the format of these array detectors. In a clean matrix, both detectors yield good detection limits. In more complex matrices, blooming, or the spilling of excess photogenerated charge from the regions of the detector which are overexposed, greatly limits the utility and sensitivity of the charge-coupled device for atomic emission spectroscopy. Several methods to improve the performance of charge-coupled device detectors are described, including preliminary work using an antiblooming charge-coupled device. The charge injection device detector is found to be highly resistant to blooming and is able to analyze complex mixtures with little to no loss in sensitivity.
AB - The performances of two classes of charge transfer device detectors-the charge-coupled device and the charge injection device-are compared for atomic emission spectroscopy. For these studies, a direct current plasma source is employed with an echelle spectrograph having a spectral image size matched to the format of these array detectors. In a clean matrix, both detectors yield good detection limits. In more complex matrices, blooming, or the spilling of excess photogenerated charge from the regions of the detector which are overexposed, greatly limits the utility and sensitivity of the charge-coupled device for atomic emission spectroscopy. Several methods to improve the performance of charge-coupled device detectors are described, including preliminary work using an antiblooming charge-coupled device. The charge injection device detector is found to be highly resistant to blooming and is able to analyze complex mixtures with little to no loss in sensitivity.
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U2 - 10.1016/0584-8547(89)80066-7
DO - 10.1016/0584-8547(89)80066-7
M3 - Article
AN - SCOPUS:0024777228
VL - 44
SP - 683
EP - 692
JO - Spectrochimica Acta, Part B: Atomic Spectroscopy
JF - Spectrochimica Acta, Part B: Atomic Spectroscopy
SN - 0584-8547
IS - 7
ER -