A mammography imaging hybrid pixel sensor test chip with low-noise CMOS readout IC on fully depleted silicon-on-insulator design

D. Nguyen, H. Cormican, A. Baysal, C. Wiswall, T. Kerr, J. M. Wang, D. Ma

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper reports the design trade off study of the design of an innovative CMOS active pixel sensor (CAPS) based on Silicon-on-Insulator (SOI) technology. The CAPS designs approach provides the flexibility and high-density features of hybrid pixel sensors with photon counting architecture. This sensor is the key component for optimized X-ray Tomosynthesis. A proof-ofprinciple test chip, paying particular attention to the noise performance of the pixel, front-end electronics (FEE) and readout speed, is available for testing in 2008. We present the design of the test chip in this paper.

Original languageEnglish (US)
Title of host publicationPenetrating Radiation Systems and Applications IX
DOIs
StatePublished - Nov 21 2008
EventPenetrating Radiation Systems and Applications IX - San Diego, CA, United States
Duration: Aug 13 2008Aug 14 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7080
ISSN (Print)0277-786X

Other

OtherPenetrating Radiation Systems and Applications IX
CountryUnited States
CitySan Diego, CA
Period8/13/088/14/08

Keywords

  • CMOS integrated circuits
  • Front end electronic
  • Hybrid pixel sensors
  • Silicon-On-Insulator (SOI) technology
  • Tomosynthesis
  • X-ray imaging

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'A mammography imaging hybrid pixel sensor test chip with low-noise CMOS readout IC on fully depleted silicon-on-insulator design'. Together they form a unique fingerprint.

Cite this