A new look inside: Wavefront analysis tool for freeform designers

Xinda Hu, Hong Hua

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We propose a new wavefront analysis tool for optical designers to evaluate the aberration contribution of each freeform surface inside a complex system, which has great advantages in determining the design form and optimization strategy.

Original languageEnglish (US)
Title of host publicationFreeform Optics, Freeform 2013
StatePublished - Dec 1 2013
EventFreeform Optics, Freeform 2013 - Tucson, AZ, United States
Duration: Nov 3 2013Nov 7 2013

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherFreeform Optics, Freeform 2013
CountryUnited States
CityTucson, AZ
Period11/3/1311/7/13

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Hu, X., & Hua, H. (2013). A new look inside: Wavefront analysis tool for freeform designers. In Freeform Optics, Freeform 2013 (Optics InfoBase Conference Papers).