A new test stand for dynamically testing coupon samples

Yan Zhang, Thomas D Milster, John Butz, Warren Bletcher

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new dynamic test stand is built to test coupon samples for volumetric bit wise optical data storage applications. An unconventional rotating head and fixed sample design is employed. Results from media samples are reported that illustrate pulse-length/power optimization and focus sensitivity. One sample is shown to be appropriate for volumetric applications based in its focus sensitivity.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages357-360
Number of pages4
Volume5069
DOIs
StatePublished - 2003
EventOptical Data Storage 2003 - Vancouver, BC, Canada
Duration: May 11 2003May 14 2003

Other

OtherOptical Data Storage 2003
CountryCanada
CityVancouver, BC
Period5/11/035/14/03

Fingerprint

test stands
Optical data storage
Testing
dynamic tests
sensitivity
data storage
optimization
pulses

Keywords

  • Dynamic test stand
  • Volumetric optical data storage

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Zhang, Y., Milster, T. D., Butz, J., & Bletcher, W. (2003). A new test stand for dynamically testing coupon samples. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5069, pp. 357-360) https://doi.org/10.1117/12.533129

A new test stand for dynamically testing coupon samples. / Zhang, Yan; Milster, Thomas D; Butz, John; Bletcher, Warren.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5069 2003. p. 357-360.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhang, Y, Milster, TD, Butz, J & Bletcher, W 2003, A new test stand for dynamically testing coupon samples. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 5069, pp. 357-360, Optical Data Storage 2003, Vancouver, BC, Canada, 5/11/03. https://doi.org/10.1117/12.533129
Zhang Y, Milster TD, Butz J, Bletcher W. A new test stand for dynamically testing coupon samples. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5069. 2003. p. 357-360 https://doi.org/10.1117/12.533129
Zhang, Yan ; Milster, Thomas D ; Butz, John ; Bletcher, Warren. / A new test stand for dynamically testing coupon samples. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5069 2003. pp. 357-360
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