A Nonparametric degradation-based method for modeling reliability growth

Cesar Ruiz, Haitao Liao, Ed Pohl

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The competitiveness of the modern business environment creates a need for shortening the development time while assuring high product reliability. In addition, recent technological advancements in sensor technology and data acquisition have made it possible to continuously monitor the health status or performance of a product during testing. Using such condition monitoring data, the designer can model the degradation process of this product and provides an informative and accurate tool for failure analysis and reliability estimation. Recently, much attention has been focused on developing new reliability growth methods in hopes of speeding up product development in a cost-effective way. To this end, accelerated testing can be conducted in a reliability growth program. One way to take advantage of both accelerated testing and degradation analysis for reliability growth is to conduct accelerated degradation testing (ADT).

Original languageEnglish (US)
Title of host publicationRAMS 2019 - 2019 Annual Reliability and Maintainability Symposium, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538665541
DOIs
StatePublished - Jan 1 2019
Event2019 Annual Reliability and Maintainability Symposium, RAMS 2019 - Orlando, United States
Duration: Jan 28 2019Jan 31 2019

Publication series

NameProceedings - Annual Reliability and Maintainability Symposium
Volume2019-January
ISSN (Print)0149-144X

Conference

Conference2019 Annual Reliability and Maintainability Symposium, RAMS 2019
CountryUnited States
CityOrlando
Period1/28/191/31/19

Keywords

  • Accelerated Degradation Testing
  • Gaussian Process
  • Reliability Growth

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Mathematics(all)
  • Computer Science Applications

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