A novel method for measuring the vertical birefringence of optical disk substrates

M. Mansuripur, Yung Chieh Hsieh

Research output: Contribution to journalArticle

Abstract

We describe a simple method of measuring vertical birefringence over the entire surface of an optical disk substrate. Our design consists of a linearly polarized He-Ne laser (1-2 mW) and a CCD camera interfaced to a computer. The measurement is non-intrusive, easy to set up, and needs only a few seconds to collect the data and plot a map of vertical birefringence over the surface area of the disk. The system described here is potentially useful as a quality control tool in substrate manufacturing environments.

Original languageEnglish (US)
Pages (from-to)8112-8114
Number of pages3
JournalApplied optics
Volume33
Issue number34
DOIs
StatePublished - Dec 1994

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

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