A reflective Gaussian coronagraph for ExAO: Laboratory performance

Ryeojin Park, Laird M Close, Nick Siegler, Eric L. Nielsen, Thomas Stalcup

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We report laboratory results of a coronagraphic testbed to assess the intensity reduction differences between a "Gaussian" tapered focal plane coronagraphic mask and a classical hard-edged "Top Hat" function mask at Extreme Adaptive Optics (ExAO) Strehl ratios of ∼94%. However, unlike a traditional coronagraph design, we insert a reflective focal plane mask at 45° to the optical axis and used a "spot of Arago blocker" (axicon stop) before a final image in order to block additional mask edge-diffracted light. The testbed simulates the optical train of ground-based telescopes (in particular the 8.1m Gemini North telescope) and includes one spider vane and different mask radii (r= 1.9λ/D, 3.7X/D, 7.4λ/D) and two types of reflective focal plane masks (hard-edged "Top Hat" and "Gaussian" tapered profiles). In order to investigate the performance of these competing coronagraphic designs with regard to extra-solar planet detection sensitivity, we utilize the simulation of realistic extra-solar planet populations (Nielsen et al. 2006). With an appropriate translation of our laboratory results to expected telescope performance, a "Gaussian" tapered mask radius of 3.7λ/D with an axicon stop performs best (highest planet detection sensitivity). For a full survey with this optimal design, the simulation predicts ∼30% more planets detected compared to a similar sized "Top Hat" function mask with an axicon stop. Using the best design, the "point contrast ratio" between the stellar PSF peak and the coronagraphic PSF at 10λ/D (0.4" in H band if D = 8.1m) is 1.4 × 10 6. This is ∼10 times higher than a classical Lyot "Top Hat" coronagraph.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6272 III
DOIs
StatePublished - 2006
EventAdvances in Adaptive Optics II - Orlando, FL, United States
Duration: May 24 2006May 31 2006

Other

OtherAdvances in Adaptive Optics II
CountryUnited States
CityOrlando, FL
Period5/24/065/31/06

Fingerprint

Adaptive optics
coronagraphs
adaptive optics
Masks
masks
Extrasolar planets
Telescopes
planet detection
telescopes
Planets
Testbeds
spiders
vanes
radii
Antenna grounds
extrasolar planets
inserts
planets
simulation
profiles

Keywords

  • Adaptive optics
  • Coronagraph
  • Extra-solar planet
  • High contrast imaging

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Park, R., Close, L. M., Siegler, N., Nielsen, E. L., & Stalcup, T. (2006). A reflective Gaussian coronagraph for ExAO: Laboratory performance. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6272 III). [62724V] https://doi.org/10.1117/12.670802

A reflective Gaussian coronagraph for ExAO : Laboratory performance. / Park, Ryeojin; Close, Laird M; Siegler, Nick; Nielsen, Eric L.; Stalcup, Thomas.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6272 III 2006. 62724V.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Park, R, Close, LM, Siegler, N, Nielsen, EL & Stalcup, T 2006, A reflective Gaussian coronagraph for ExAO: Laboratory performance. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6272 III, 62724V, Advances in Adaptive Optics II, Orlando, FL, United States, 5/24/06. https://doi.org/10.1117/12.670802
Park R, Close LM, Siegler N, Nielsen EL, Stalcup T. A reflective Gaussian coronagraph for ExAO: Laboratory performance. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6272 III. 2006. 62724V https://doi.org/10.1117/12.670802
Park, Ryeojin ; Close, Laird M ; Siegler, Nick ; Nielsen, Eric L. ; Stalcup, Thomas. / A reflective Gaussian coronagraph for ExAO : Laboratory performance. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6272 III 2006.
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