A robust finite-point based gate model considering process variations

Alex Mitev, Dinesh Ganesan, Dheepan Shanmugasundaram, Yu Cao, Janet M. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

This paper proposes a robust gate model based on a finite-point modeling scheme. With current source model (CSM) framework, a robust, finite-point gate model is constructed. The new model depends on the selective points of I-V curves of gates. Thus, it implicitly incorporates the variation related parameters into finite points. In addition, to provide good accuracy on output waveform, the new model creates the input and output capacitance elements as nonlinear dependency on input/output waveform and process variation parameters. Experimental results show that the generated gate model has less than 3.7% error at mean, less than 6.2% error at variance and less than 5.8% at 90% percentile for cumulative density functions (CDFs).

Original languageEnglish (US)
Title of host publication2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
Pages692-697
Number of pages6
DOIs
StatePublished - Dec 1 2007
Event2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD - San Jose, CA, United States
Duration: Nov 4 2007Nov 8 2007

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Other

Other2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
CountryUnited States
CitySan Jose, CA
Period11/4/0711/8/07

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ASJC Scopus subject areas

  • Software
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

Cite this

Mitev, A., Ganesan, D., Shanmugasundaram, D., Cao, Y., & Wang, J. M. (2007). A robust finite-point based gate model considering process variations. In 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD (pp. 692-697). [4397346] (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). https://doi.org/10.1109/ICCAD.2007.4397346