A test stand for the MMT observatory adaptive secondary

T. Stalcup, Philip M Hinz, O. Durney, T. Connors, Mopidevi R. Mopidevi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

The original testing and calibration of the adaptive optics system at the MMT Observatory was done with a large scale telescope simulator. This allowed testing the entire system in closed loop, including the adaptive secondary and the wavefront sensor optics. This was an effective way to perform the initial development and calibration of the system, but it is impractical to maintain such a large system for routine calibration of the adaptive secondary. Since it is a convex asphere, it cannot be tested with simple methods such as placing a point source at the center of curvature. The MMT AO Test Stand is a compact system that allows testing the convex aspheric secondary. It can be used to update the calibration of the thin shell secondary mirror as well as allowing development of new capabilities such as higher performance control loops and chopping. The test stand is small enough to fit in the clean room used for routine mirror storage and maintenance. Design, alignment, and testing results are presented.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7015
DOIs
StatePublished - 2008
EventAdaptive Optics Systems - Marseille, France
Duration: Jun 23 2008Jun 26 2008

Other

OtherAdaptive Optics Systems
CountryFrance
CityMarseille
Period6/23/086/26/08

Fingerprint

test stands
Observatories
Observatory
observatories
Calibration
Testing
Mirrors
mirrors
aspheric optics
clean rooms
Mirror
Clean rooms
Adaptive optics
Asphere
Wavefronts
adaptive optics
Wavefront Sensor
Telescopes
Thin Shells
point sources

Keywords

  • Adaptive Optics
  • Adaptive Secondary
  • Calibration
  • Hindle test
  • MMT
  • MMTAO
  • Test Stand

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Stalcup, T., Hinz, P. M., Durney, O., Connors, T., & R. Mopidevi, M. (2008). A test stand for the MMT observatory adaptive secondary. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7015). [701565] https://doi.org/10.1117/12.790125

A test stand for the MMT observatory adaptive secondary. / Stalcup, T.; Hinz, Philip M; Durney, O.; Connors, T.; R. Mopidevi, Mopidevi.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7015 2008. 701565.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Stalcup, T, Hinz, PM, Durney, O, Connors, T & R. Mopidevi, M 2008, A test stand for the MMT observatory adaptive secondary. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7015, 701565, Adaptive Optics Systems, Marseille, France, 6/23/08. https://doi.org/10.1117/12.790125
Stalcup T, Hinz PM, Durney O, Connors T, R. Mopidevi M. A test stand for the MMT observatory adaptive secondary. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7015. 2008. 701565 https://doi.org/10.1117/12.790125
Stalcup, T. ; Hinz, Philip M ; Durney, O. ; Connors, T. ; R. Mopidevi, Mopidevi. / A test stand for the MMT observatory adaptive secondary. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7015 2008.
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