Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array

Zhu Zhao, Mei Hui, Ping Zhou, Tianquan Su, Yun Feng, Yuejin Zhao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Low order aberration was founded when focused Gaussian beam imaging at Kodak KAI -16000 image detector, which is integrated with lenslet array. Effect of focused Gaussian beam and numerical simulation calculation of the aberration were presented in this paper. First, we set up a model of optical imaging system based on previous experiment. Focused Gaussian beam passed through a pinhole and was received by Kodak KAI -16000 image detector whose microlenses of lenslet array were exactly focused on sensor surface. Then, we illustrated the characteristics of focused Gaussian beam and the effect of relative space position relations between waist of Gaussian beam and front spherical surface of microlenses to the aberration. Finally, we analyzed the main element of low order aberration and calculated the spherical aberration caused by lenslet array according to the results of above two steps. Our theoretical calculations shown that, the numerical simulation had a good agreement with the experimental result. Our research results proved that spherical aberration was the main element and made up about 93.44% of the 48 nm error, which was demonstrated in previous experiment. The spherical aberration is inversely proportional to the value of divergence distance between microlens and waist, and directly proportional to the value of the Gaussian beam waist radius.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9195
ISBN (Print)9781628412222
DOIs
StatePublished - 2014
EventOptical System Alignment, Tolerancing, and Verification VIII - San Diego, United States
Duration: Aug 17 2014Aug 18 2014

Other

OtherOptical System Alignment, Tolerancing, and Verification VIII
CountryUnited States
CitySan Diego
Period8/17/148/18/14

Fingerprint

Gaussian Beam
Gaussian beams
Aberrations
Aberration
aberration
Microlenses
Directly proportional
Detector
Detectors
Microlens
Numerical Simulation
Optical Imaging
detectors
Computer simulation
pinholes
Imaging System
Imaging systems
Optical System
Experiment
Divergence

Keywords

  • Gaussian beam
  • Microlens of lenslet array
  • Spherical aberration
  • Waist radius

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Zhao, Z., Hui, M., Zhou, P., Su, T., Feng, Y., & Zhao, Y. (2014). Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9195). [91950I] SPIE. https://doi.org/10.1117/12.2060476

Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array. / Zhao, Zhu; Hui, Mei; Zhou, Ping; Su, Tianquan; Feng, Yun; Zhao, Yuejin.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9195 SPIE, 2014. 91950I.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhao, Z, Hui, M, Zhou, P, Su, T, Feng, Y & Zhao, Y 2014, Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 9195, 91950I, SPIE, Optical System Alignment, Tolerancing, and Verification VIII, San Diego, United States, 8/17/14. https://doi.org/10.1117/12.2060476
Zhao Z, Hui M, Zhou P, Su T, Feng Y, Zhao Y. Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9195. SPIE. 2014. 91950I https://doi.org/10.1117/12.2060476
Zhao, Zhu ; Hui, Mei ; Zhou, Ping ; Su, Tianquan ; Feng, Yun ; Zhao, Yuejin. / Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9195 SPIE, 2014.
@inproceedings{48da58b90ba94bc296ccd45efbc8bcd0,
title = "Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array",
abstract = "Low order aberration was founded when focused Gaussian beam imaging at Kodak KAI -16000 image detector, which is integrated with lenslet array. Effect of focused Gaussian beam and numerical simulation calculation of the aberration were presented in this paper. First, we set up a model of optical imaging system based on previous experiment. Focused Gaussian beam passed through a pinhole and was received by Kodak KAI -16000 image detector whose microlenses of lenslet array were exactly focused on sensor surface. Then, we illustrated the characteristics of focused Gaussian beam and the effect of relative space position relations between waist of Gaussian beam and front spherical surface of microlenses to the aberration. Finally, we analyzed the main element of low order aberration and calculated the spherical aberration caused by lenslet array according to the results of above two steps. Our theoretical calculations shown that, the numerical simulation had a good agreement with the experimental result. Our research results proved that spherical aberration was the main element and made up about 93.44{\%} of the 48 nm error, which was demonstrated in previous experiment. The spherical aberration is inversely proportional to the value of divergence distance between microlens and waist, and directly proportional to the value of the Gaussian beam waist radius.",
keywords = "Gaussian beam, Microlens of lenslet array, Spherical aberration, Waist radius",
author = "Zhu Zhao and Mei Hui and Ping Zhou and Tianquan Su and Yun Feng and Yuejin Zhao",
year = "2014",
doi = "10.1117/12.2060476",
language = "English (US)",
isbn = "9781628412222",
volume = "9195",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",

}

TY - GEN

T1 - Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array

AU - Zhao, Zhu

AU - Hui, Mei

AU - Zhou, Ping

AU - Su, Tianquan

AU - Feng, Yun

AU - Zhao, Yuejin

PY - 2014

Y1 - 2014

N2 - Low order aberration was founded when focused Gaussian beam imaging at Kodak KAI -16000 image detector, which is integrated with lenslet array. Effect of focused Gaussian beam and numerical simulation calculation of the aberration were presented in this paper. First, we set up a model of optical imaging system based on previous experiment. Focused Gaussian beam passed through a pinhole and was received by Kodak KAI -16000 image detector whose microlenses of lenslet array were exactly focused on sensor surface. Then, we illustrated the characteristics of focused Gaussian beam and the effect of relative space position relations between waist of Gaussian beam and front spherical surface of microlenses to the aberration. Finally, we analyzed the main element of low order aberration and calculated the spherical aberration caused by lenslet array according to the results of above two steps. Our theoretical calculations shown that, the numerical simulation had a good agreement with the experimental result. Our research results proved that spherical aberration was the main element and made up about 93.44% of the 48 nm error, which was demonstrated in previous experiment. The spherical aberration is inversely proportional to the value of divergence distance between microlens and waist, and directly proportional to the value of the Gaussian beam waist radius.

AB - Low order aberration was founded when focused Gaussian beam imaging at Kodak KAI -16000 image detector, which is integrated with lenslet array. Effect of focused Gaussian beam and numerical simulation calculation of the aberration were presented in this paper. First, we set up a model of optical imaging system based on previous experiment. Focused Gaussian beam passed through a pinhole and was received by Kodak KAI -16000 image detector whose microlenses of lenslet array were exactly focused on sensor surface. Then, we illustrated the characteristics of focused Gaussian beam and the effect of relative space position relations between waist of Gaussian beam and front spherical surface of microlenses to the aberration. Finally, we analyzed the main element of low order aberration and calculated the spherical aberration caused by lenslet array according to the results of above two steps. Our theoretical calculations shown that, the numerical simulation had a good agreement with the experimental result. Our research results proved that spherical aberration was the main element and made up about 93.44% of the 48 nm error, which was demonstrated in previous experiment. The spherical aberration is inversely proportional to the value of divergence distance between microlens and waist, and directly proportional to the value of the Gaussian beam waist radius.

KW - Gaussian beam

KW - Microlens of lenslet array

KW - Spherical aberration

KW - Waist radius

UR - http://www.scopus.com/inward/record.url?scp=84923096781&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84923096781&partnerID=8YFLogxK

U2 - 10.1117/12.2060476

DO - 10.1117/12.2060476

M3 - Conference contribution

AN - SCOPUS:84923096781

SN - 9781628412222

VL - 9195

BT - Proceedings of SPIE - The International Society for Optical Engineering

PB - SPIE

ER -