Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array

Zhu Zhao, Mei Hui, Ping Zhou, Tianquan Su, Yun Feng, Yuejin Zhao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Low order aberration was founded when focused Gaussian beam imaging at Kodak KAI -16000 image detector, which is integrated with lenslet array. Effect of focused Gaussian beam and numerical simulation calculation of the aberration were presented in this paper. First, we set up a model of optical imaging system based on previous experiment. Focused Gaussian beam passed through a pinhole and was received by Kodak KAI -16000 image detector whose microlenses of lenslet array were exactly focused on sensor surface. Then, we illustrated the characteristics of focused Gaussian beam and the effect of relative space position relations between waist of Gaussian beam and front spherical surface of microlenses to the aberration. Finally, we analyzed the main element of low order aberration and calculated the spherical aberration caused by lenslet array according to the results of above two steps. Our theoretical calculations shown that, the numerical simulation had a good agreement with the experimental result. Our research results proved that spherical aberration was the main element and made up about 93.44% of the 48 nm error, which was demonstrated in previous experiment. The spherical aberration is inversely proportional to the value of divergence distance between microlens and waist, and directly proportional to the value of the Gaussian beam waist radius.

Original languageEnglish (US)
Title of host publicationOptical System Alignment, Tolerancing, and Verification VIII
EditorsRichard N. Youngworth, Jose Sasian
PublisherSPIE
ISBN (Electronic)9781628412222
DOIs
StatePublished - Jan 1 2014
EventOptical System Alignment, Tolerancing, and Verification VIII - San Diego, United States
Duration: Aug 17 2014Aug 18 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9195
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptical System Alignment, Tolerancing, and Verification VIII
CountryUnited States
CitySan Diego
Period8/17/148/18/14

Keywords

  • Gaussian beam
  • Microlens of lenslet array
  • Spherical aberration
  • Waist radius

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array'. Together they form a unique fingerprint.

  • Cite this

    Zhao, Z., Hui, M., Zhou, P., Su, T., Feng, Y., & Zhao, Y. (2014). Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array. In R. N. Youngworth, & J. Sasian (Eds.), Optical System Alignment, Tolerancing, and Verification VIII [91950I] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9195). SPIE. https://doi.org/10.1117/12.2060476