Accelerated acceptance sampling plan with asymmetrical information

Dayu Chen, Xiaoyang Li, Rui Kang, Haitao Liao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

With the development of science and technology, long-life products have been prevalent in the market, and it is necessary to apply accelerated testing techniques to product demonstration. At the same time, the researchers designed the accelerated acceptance sampling plan with the producer risk and consumer risk that are known, which lacked the scientific basis. Based on the knowledge of incomplete information static game and considering that the acceleration factor (AF) has been acquired, this paper takes the risk of producers and users as unknown in AASP and takes the risk equivalence as the goal and then designs AASP, which solves the problem of producer risk and consumer risk that are not scientific and strict. Finally the numerical case is given and the correctness of the method is verified.

Original languageEnglish (US)
Title of host publication2017 2nd International Conference on System Reliability and Safety, ICSRS 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages250-254
Number of pages5
Volume2018-January
ISBN (Electronic)9781538633229
DOIs
StatePublished - Jan 29 2018
Externally publishedYes
Event2nd International Conference on System Reliability and Safety, ICSRS 2017 - Milan, Italy
Duration: Dec 20 2017Dec 22 2017

Other

Other2nd International Conference on System Reliability and Safety, ICSRS 2017
CountryItaly
CityMilan
Period12/20/1712/22/17

Keywords

  • accelerated acceptance sampling plan
  • acceleration factor
  • incomplete information static game
  • producer and consumer risks

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Control and Optimization
  • Modeling and Simulation

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  • Cite this

    Chen, D., Li, X., Kang, R., & Liao, H. (2018). Accelerated acceptance sampling plan with asymmetrical information. In 2017 2nd International Conference on System Reliability and Safety, ICSRS 2017 (Vol. 2018-January, pp. 250-254). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSRS.2017.8272830