We present an adaptive feature-specific imaging (AFSI) system for application to an M-class recognition task. The proposed system uses nearest-neighbor-based density estimation to compute the (non-Gaussian) class-conditional densities. We refine the density estimates based on the training data and the knowledge from previous measurements at each step. The projection basis for the AFSI system is also adapted based on the previous measurements at each step. The decision-making process is based on sequential hypothesis testing. We quantify the number of measurements required to achieve a specified probability of error (Pe) and we compare the AFSI system with an adaptive-conventional (ACONV) system. The AFSI system exhibits significant improvement compared to the ACONV system at low signal-to-noise ratio (SNR), and it is shown that, for an M = 4 hypotheses, SNR = -10 dB, and a desired Pe = 10-2, the AFSI system requires 30 times fewer measurements than the ACONV system. Experimental results validating the AFSI system are presented.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering