Adsorption of collectors on chalcopyrite surface studied by an AFM

Jinhong Zhang, Wei Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

An atomic force microscopy (AFM) has been applied to study the adsorption of collectors on chalcopyrite surface in aqueous solutions. AFM images showed that collectors absorbed on mineral surface in patches after the chalcopyrite sample was soaked in potassium ethyl xanthate (KEX) or potassium amyl xanthate (PAX) solutions at pH 11. At the same time, as shown by the obtained AFM force curves, the adhesion between the AFM tip and the substrate increased greatly due to the collector adsorption. Rinsing with ethanol removed the patch-like absorbate instantly from the chalcopyrite surface. Patch-like absorbate was also observed on chalcopyrite surface in the solutions of two industrial collectors, i.e., Col-1 and Col-2. The potential impact of this patches adsorption on chalcopyrite flotation is discussed.

Original languageEnglish (US)
Title of host publicationSeparation Technologies for Minerals, Coal, and Earth Resources
Pages65-73
Number of pages9
StatePublished - May 14 2012
EventInternational Symposium on Separation Technologies for Minerals, Coal, and Earth Resources, Part of the 2011 SME Annual Meeting - Denver, CO, United States
Duration: Feb 27 2011Mar 2 2011

Publication series

NameSeparation Technologies for Minerals, Coal, and Earth Resources

Other

OtherInternational Symposium on Separation Technologies for Minerals, Coal, and Earth Resources, Part of the 2011 SME Annual Meeting
Country/TerritoryUnited States
CityDenver, CO
Period2/27/113/2/11

ASJC Scopus subject areas

  • Geochemistry and Petrology
  • Geology

Fingerprint

Dive into the research topics of 'Adsorption of collectors on chalcopyrite surface studied by an AFM'. Together they form a unique fingerprint.

Cite this