Advances in modeling polarimeter performance

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Artifacts in polarimeters are apparent polarization features which are not real but result from the systematic errors in the polarimeter. The polarization artifacts are different between division of focal plane, spectral, and time modulation polarimeters. Artifacts result from many sources such as source properties, micropolarizer arrays, coatings issues, vibrations, and stress birefringence. A modeling examples of polarization artifacts due to a micro-polarizer array polarimeter is presented.

Original languageEnglish (US)
Title of host publicationPolarization Science and Remote Sensing VIII
EditorsJoseph A. Shaw, Frans Snik
PublisherSPIE
ISBN (Electronic)9781510612716
DOIs
StatePublished - Jan 1 2017
EventPolarization Science and Remote Sensing VIII 2017 - San Diego, United States
Duration: Aug 8 2017Aug 9 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10407
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherPolarization Science and Remote Sensing VIII 2017
CountryUnited States
CitySan Diego
Period8/8/178/9/17

Keywords

  • Coronagraph
  • Imaging
  • Polarization
  • Polarization aberration
  • Polarization ray tracing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Chipman, R. A. (2017). Advances in modeling polarimeter performance. In J. A. Shaw, & F. Snik (Eds.), Polarization Science and Remote Sensing VIII [1040707] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10407). SPIE. https://doi.org/10.1117/12.2274506