Advances in Polarization Metrology

Research output: Contribution to journalConference article

Abstract

Three new polarimeters are described which represent advances in polarization metrology capabilities. Two are at a new polarization laboratory started at the University of Arizona's Optical Sciences Center, (1) a Fiber Optic Spectropolarimeter and (2) a High Speed Mueller Matrix Imaging Polarimeter. The third is a new visible Mueller Matrix Spectropolarimeter for optical component test from a startup company, Axometrics, which is useful for detailed characterization of optical components and thin films via spectra of diattenuation, retardance, and depolarization.

Original languageEnglish (US)
Pages (from-to)43-50
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5174
DOIs
StatePublished - Dec 1 2003
EventNovel Optical Systems Design and Optimization VI - San Diego, CA, United States
Duration: Aug 4 2003Aug 4 2003

Keywords

  • Depolarization
  • Diattenuation
  • Metrology
  • Mueller matrices
  • Polarimetry
  • Polarization dependent loss
  • Polarizers
  • Retardance
  • Retarders

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Advances in Polarization Metrology'. Together they form a unique fingerprint.

  • Cite this