Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry

Elizabeth A. Sornsin, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

An infrared achromatic retarder was aligned and characterized using the University of Alabama in Huntsville's Fourier Transform Infrared (FTIR) Spectropolarimeter. The FTIR Spectropolarimeter produces a full polarization description of a sample over wavelengths 3-14μm. Mueller matrices were measured for different relative alignments between the complementary plates of the achromat until the retardance orientation variation was reduced to within ±1° and the retardance magnitude varied smoothly with a peak-to-valley difference of 24° from 4-14μm. The results presented here include the progression of retardance magnitudes and retardance orientations as the plate alignment varied as well as the final Mueller matrix and retardance components of the achromat element.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsD.H. Goldstein, R.A. Chipman
Pages28-34
Number of pages7
Volume3121
DOIs
StatePublished - 1997
Externally publishedYes
EventPolarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States
Duration: Jul 30 1997Aug 1 1997

Other

OtherPolarization: Measurement, Analysis, and Remote Sensing
CountryUnited States
CitySan Diego, CA
Period7/30/978/1/97

Fingerprint

retarders
polarimeters
Fourier transforms
alignment
Calibration
Infrared radiation
matrices
progressions
valleys
polarization
wavelengths
Polarization
Wavelength

Keywords

  • Achromatic retarder
  • Mueller matrix
  • Retardance vector
  • Spectropolarimetry

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Sornsin, E. A., & Chipman, R. A. (1997). Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry. In D. H. Goldstein, & R. A. Chipman (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3121, pp. 28-34) https://doi.org/10.1117/12.283867

Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry. / Sornsin, Elizabeth A.; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / D.H. Goldstein; R.A. Chipman. Vol. 3121 1997. p. 28-34.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sornsin, EA & Chipman, RA 1997, Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry. in DH Goldstein & RA Chipman (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 3121, pp. 28-34, Polarization: Measurement, Analysis, and Remote Sensing, San Diego, CA, United States, 7/30/97. https://doi.org/10.1117/12.283867
Sornsin EA, Chipman RA. Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry. In Goldstein DH, Chipman RA, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3121. 1997. p. 28-34 https://doi.org/10.1117/12.283867
Sornsin, Elizabeth A. ; Chipman, Russell A. / Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry. Proceedings of SPIE - The International Society for Optical Engineering. editor / D.H. Goldstein ; R.A. Chipman. Vol. 3121 1997. pp. 28-34
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