Alignment of a three-mirror telescope using the sine condition test

David Sommitz, Matthew Dubin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The Sine Condition Test has been experimentally demonstrated as an effective tool for measuring linearly field dependent aberrations in simple optical systems. Simulations have also shown that it can be used to provide feedback as part of an alignment procedure for more complex systems. In this paper we show how the Sine Condition Test was used as part of the process for aligning a three mirror telescope. We present the basic concept of the Sine Condition Test, how it was implemented in our system and the experimental results from multiple alignments. Finally, we compare our experimental results to simulated results.

Original languageEnglish (US)
Title of host publicationOptical System Alignment, Tolerancing, and Verification XII
EditorsJose Sasian, Richard N. Youngworth
PublisherSPIE
ISBN (Electronic)9781510620650
DOIs
StatePublished - 2018
EventOptical System Alignment, Tolerancing, and Verification XII 2018 - San Diego, United States
Duration: Aug 19 2018Aug 20 2018

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10747
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptical System Alignment, Tolerancing, and Verification XII 2018
CountryUnited States
CitySan Diego
Period8/19/188/20/18

Keywords

  • Abbe Sine Condition
  • Alignment
  • Sine Condition Test
  • TMA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Sommitz, D., & Dubin, M. (2018). Alignment of a three-mirror telescope using the sine condition test. In J. Sasian, & R. N. Youngworth (Eds.), Optical System Alignment, Tolerancing, and Verification XII [1074702] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10747). SPIE. https://doi.org/10.1117/12.2320689