All-optical control of transverse patterns in planar semiconductor microcavities

M. H. Luk, Y. C. Tse, N. H. Kwong, P. T. Leung, S. Schumacher, R. Binder

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We analyze the selection/switching of instability-induced optical patterns in semiconductor microcavities. Besides realistic calculations, we use a population model and Catastrophe theory to organize our understanding of the patterns' dynamics.

Original languageEnglish (US)
Title of host publication2012 Conference on Lasers and Electro-Optics, CLEO 2012
StatePublished - Dec 6 2012
Event2012 Conference on Lasers and Electro-Optics, CLEO 2012 - San Jose, CA, United States
Duration: May 6 2012May 11 2012

Publication series

Name2012 Conference on Lasers and Electro-Optics, CLEO 2012

Other

Other2012 Conference on Lasers and Electro-Optics, CLEO 2012
CountryUnited States
CitySan Jose, CA
Period5/6/125/11/12

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Luk, M. H., Tse, Y. C., Kwong, N. H., Leung, P. T., Schumacher, S., & Binder, R. (2012). All-optical control of transverse patterns in planar semiconductor microcavities. In 2012 Conference on Lasers and Electro-Optics, CLEO 2012 [6326666] (2012 Conference on Lasers and Electro-Optics, CLEO 2012).