Amplitude and phase apodization caused by focusing light through an evanescent gap in SIL recorders

Joshua S. Jo, Thomas D Milster, J. Kevin Erwin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

High numerical aperture(NA) vector diffraction theory is used to analyze a near field optical system using a solid immersion lens (SIL). The amplitude and phase of the transmitted light through the system changes as a function of the air gap height as well as indices of refraction, incident angle, etc. We call these `amplitude apodization' and `phase apodization'. The characteristics of those are done using supergaussian form. The effects of amplitude and phase apodization on irradiance are investigated for various index of refraction and air gap height.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages135-142
Number of pages8
Volume4081
StatePublished - 2000
EventOptical Storage and Optical Information Processing - Taipei, Taiwan
Duration: Jul 26 2000Jul 27 2000

Other

OtherOptical Storage and Optical Information Processing
CityTaipei, Taiwan
Period7/26/007/27/00

Fingerprint

apodization
recorders
Refraction
submerging
Lenses
lenses
refraction
Air
Optical systems
Diffraction
air
numerical aperture
irradiance
near fields
diffraction

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Jo, J. S., Milster, T. D., & Erwin, J. K. (2000). Amplitude and phase apodization caused by focusing light through an evanescent gap in SIL recorders. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4081, pp. 135-142). Society of Photo-Optical Instrumentation Engineers.

Amplitude and phase apodization caused by focusing light through an evanescent gap in SIL recorders. / Jo, Joshua S.; Milster, Thomas D; Erwin, J. Kevin.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4081 Society of Photo-Optical Instrumentation Engineers, 2000. p. 135-142.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Jo, JS, Milster, TD & Erwin, JK 2000, Amplitude and phase apodization caused by focusing light through an evanescent gap in SIL recorders. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 4081, Society of Photo-Optical Instrumentation Engineers, pp. 135-142, Optical Storage and Optical Information Processing, Taipei, Taiwan, 7/26/00.
Jo JS, Milster TD, Erwin JK. Amplitude and phase apodization caused by focusing light through an evanescent gap in SIL recorders. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4081. Society of Photo-Optical Instrumentation Engineers. 2000. p. 135-142
Jo, Joshua S. ; Milster, Thomas D ; Erwin, J. Kevin. / Amplitude and phase apodization caused by focusing light through an evanescent gap in SIL recorders. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 4081 Society of Photo-Optical Instrumentation Engineers, 2000. pp. 135-142
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