An AFM study of chalcopyrite surface in aqueous solution

J. Zhang, W. Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

The surface of chalcopyrite was studied in situ in aqueous solution by an atomic force microscopy (AFM). The AFM images showed that some absorbate in patches was detected on the mineral surface, after the chalcopyrite sample was soaked in 5×10-4M potassium ethyl xanthate (KEX) solution at pH 11 for 10 minutes. These patches increased in size with time elapsing. At the same time, as shown by the obtained AFM force curves, the adhesion between the AFM tip and the substrate increased greatly due to the adsorption. Rinsing with ethanol removed the absorbate from the chalcopyrite surface, as well as the big adhesion observed in KEX solution.

Original languageEnglish (US)
Title of host publicationSME Annual Meeting and Exhibit 2010
Pages535-539
Number of pages5
StatePublished - 2010
EventSME Annual Meeting and Exhibit 2010 - Phoenix, AZ, United States
Duration: Feb 28 2010Mar 3 2010

Publication series

NameSME Annual Meeting and Exhibit 2010

Other

OtherSME Annual Meeting and Exhibit 2010
Country/TerritoryUnited States
CityPhoenix, AZ
Period2/28/103/3/10

ASJC Scopus subject areas

  • Geochemistry and Petrology
  • Geology
  • Geotechnical Engineering and Engineering Geology

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