An analysis on measurement sensitivity of short-pulse propagation technique using a virtual test bench

Zhen Zhou, Alina Deutsch, Kathleen L. Melde, George A. Katopis, Jason D. Morsey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This paper presents the concept of using a virtual test bench to emulate measurements via simulation and modeling. For demonstration purposes, this idea is used to quantify the measurement sensitivity of the Short-Pulse Propagation technique to the line parameter tolerances found in production level circuit boards without building the hardware. This method is applicable to other measurement methodologies such as in the calibration and de embedding steps of frequency-domain characterization.

Original languageEnglish (US)
Title of host publicationElectrical Performance of Electronic Packaging, EPEP 2008
Pages213-216
Number of pages4
DOIs
StatePublished - Dec 31 2008
Event17th Conference on Electrical Performance of Electronic Packaging, EPEP 2008 - San Jose, CA, United States
Duration: Oct 27 2008Oct 29 2008

Publication series

NameElectrical Performance of Electronic Packaging, EPEP

Other

Other17th Conference on Electrical Performance of Electronic Packaging, EPEP 2008
CountryUnited States
CitySan Jose, CA
Period10/27/0810/29/08

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Zhou, Z., Deutsch, A., Melde, K. L., Katopis, G. A., & Morsey, J. D. (2008). An analysis on measurement sensitivity of short-pulse propagation technique using a virtual test bench. In Electrical Performance of Electronic Packaging, EPEP 2008 (pp. 213-216). [4675917] (Electrical Performance of Electronic Packaging, EPEP). https://doi.org/10.1109/EPEP.2008.4675917