Abstract
We develop a generalized Extended Linear Hazard Regression (ELHR) model with linear time-varying coefficients to estimate reliability under normal operating conditions using failure time data obtained from accelerated conditions. The model considers the effect of proportional hazards, time-varying coefficients and also time-scale changes. Extensive simulation experiments demonstrate that the ELHR model provides more accurate reliability estimates than those obtained using existing accelerated life testing models. We utilize the ELHR model to study the time-dependent dielectric breakdown of thermal oxides on n-type 6H-SiC using laboratory data. The results show that oxide reliability considerations effectively preclude SiC MOS devices from many high-temperature applications.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 329-340 |
| Number of pages | 12 |
| Journal | IIE Transactions (Institute of Industrial Engineers) |
| Volume | 38 |
| Issue number | 4 |
| DOIs | |
| State | Published - Apr 2006 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Industrial and Manufacturing Engineering
- Management Science and Operations Research
Cite this
An extended linear hazard regression model with application to time-dependent dielectric breakdown of thermal oxides. / Elsayed, Elsayed A.; Liao, Haitao; Wang, Xindong.
In: IIE Transactions (Institute of Industrial Engineers), Vol. 38, No. 4, 04.2006, p. 329-340.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - An extended linear hazard regression model with application to time-dependent dielectric breakdown of thermal oxides
AU - Elsayed, Elsayed A.
AU - Liao, Haitao
AU - Wang, Xindong
PY - 2006/4
Y1 - 2006/4
N2 - We develop a generalized Extended Linear Hazard Regression (ELHR) model with linear time-varying coefficients to estimate reliability under normal operating conditions using failure time data obtained from accelerated conditions. The model considers the effect of proportional hazards, time-varying coefficients and also time-scale changes. Extensive simulation experiments demonstrate that the ELHR model provides more accurate reliability estimates than those obtained using existing accelerated life testing models. We utilize the ELHR model to study the time-dependent dielectric breakdown of thermal oxides on n-type 6H-SiC using laboratory data. The results show that oxide reliability considerations effectively preclude SiC MOS devices from many high-temperature applications.
AB - We develop a generalized Extended Linear Hazard Regression (ELHR) model with linear time-varying coefficients to estimate reliability under normal operating conditions using failure time data obtained from accelerated conditions. The model considers the effect of proportional hazards, time-varying coefficients and also time-scale changes. Extensive simulation experiments demonstrate that the ELHR model provides more accurate reliability estimates than those obtained using existing accelerated life testing models. We utilize the ELHR model to study the time-dependent dielectric breakdown of thermal oxides on n-type 6H-SiC using laboratory data. The results show that oxide reliability considerations effectively preclude SiC MOS devices from many high-temperature applications.
UR - http://www.scopus.com/inward/record.url?scp=33644630247&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33644630247&partnerID=8YFLogxK
U2 - 10.1080/07408170500208362
DO - 10.1080/07408170500208362
M3 - Article
AN - SCOPUS:33644630247
VL - 38
SP - 329
EP - 340
JO - IISE Transactions
JF - IISE Transactions
SN - 2472-5854
IS - 4
ER -