An extended linear hazard regression model with application to time-dependent dielectric breakdown of thermal oxides

Elsayed A. Elsayed, Haitao Liao, Xindong Wang

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

We develop a generalized Extended Linear Hazard Regression (ELHR) model with linear time-varying coefficients to estimate reliability under normal operating conditions using failure time data obtained from accelerated conditions. The model considers the effect of proportional hazards, time-varying coefficients and also time-scale changes. Extensive simulation experiments demonstrate that the ELHR model provides more accurate reliability estimates than those obtained using existing accelerated life testing models. We utilize the ELHR model to study the time-dependent dielectric breakdown of thermal oxides on n-type 6H-SiC using laboratory data. The results show that oxide reliability considerations effectively preclude SiC MOS devices from many high-temperature applications.

Original languageEnglish (US)
Pages (from-to)329-340
Number of pages12
JournalIIE Transactions (Institute of Industrial Engineers)
Volume38
Issue number4
DOIs
StatePublished - Apr 2006
Externally publishedYes

Fingerprint

Electric breakdown
Hazards
Oxides
MOS devices
High temperature applications
Hot Temperature
Regression model
Breakdown
Hazard
Testing
Experiments
Time-varying coefficients

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Management Science and Operations Research

Cite this

An extended linear hazard regression model with application to time-dependent dielectric breakdown of thermal oxides. / Elsayed, Elsayed A.; Liao, Haitao; Wang, Xindong.

In: IIE Transactions (Institute of Industrial Engineers), Vol. 38, No. 4, 04.2006, p. 329-340.

Research output: Contribution to journalArticle

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