An extended linear hazard regression model with application to time-dependent dielectric breakdown of thermal oxides

Elsayed A. Elsayed, Haitao Liao, Xindong Wang

Research output: Contribution to journalArticle

26 Scopus citations


We develop a generalized Extended Linear Hazard Regression (ELHR) model with linear time-varying coefficients to estimate reliability under normal operating conditions using failure time data obtained from accelerated conditions. The model considers the effect of proportional hazards, time-varying coefficients and also time-scale changes. Extensive simulation experiments demonstrate that the ELHR model provides more accurate reliability estimates than those obtained using existing accelerated life testing models. We utilize the ELHR model to study the time-dependent dielectric breakdown of thermal oxides on n-type 6H-SiC using laboratory data. The results show that oxide reliability considerations effectively preclude SiC MOS devices from many high-temperature applications.

Original languageEnglish (US)
Pages (from-to)329-340
Number of pages12
JournalIIE Transactions (Institute of Industrial Engineers)
Issue number4
Publication statusPublished - Apr 2006
Externally publishedYes


ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Management Science and Operations Research

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