Analysis of a material phase shifting element in an atom interferometer

John D. Perreault, Alexander D Cronin

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The interaction of Na atoms with a surface was probed by inserting a nanofabricated material grating into one arm of an atom interferometer (IFM). This technique permits a direct measurement of the change in phase and coherence of matter waves as they pass within 25 nm of the grating bar surface. The practical concerns and challenges of making such a measurement are discussed here. Interference of spurious diffraction orders, IFM path overlap, and the partial obscuration of IFM beams are all important aspects of this experiment. The systematic effects that contribute to the measured phase shift and contrast are discussed.

Original languageEnglish (US)
Pages (from-to)146-150
Number of pages5
JournalJournal of Physics: Conference Series
Volume19
Issue number1
DOIs
StatePublished - Jan 1 2005

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interferometers
gratings
atoms
phase contrast
occultation
phase shift
interference
diffraction
interactions

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Analysis of a material phase shifting element in an atom interferometer. / Perreault, John D.; Cronin, Alexander D.

In: Journal of Physics: Conference Series, Vol. 19, No. 1, 01.01.2005, p. 146-150.

Research output: Contribution to journalArticle

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