Diffracted image patterns from volume holograms that are used in volume holographic imaging systems (VHISs) are investigated. It is shown that, in VHISs, prior information about the shape and spectral properties of the diffracted patterns is important not only to determine the curvature and field of view of the image, but also for image registration and noise removal. A new methodology to study numerically and analytically the dependence of VHIS diffraction patterns with the hologramconstruction parameters and the readout wavelength is described. Modeling and experimental results demonstrate that, in most cases, VHIS diffracted shapes can be accurately represented by hyperbolas.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering