Analysis of disorder-induced dephasing

S. Weiser, T. Meier, J. Moebius, A. Euteneuer, E. J. Mayer, W. Stolz, M. Hofmann, W. W. Ruehle, P. Thomas, Stephan W Koch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The origin of the polarization-dependent decay of the time-integrated four-wave-mixing is examined by microscopic model calculations, including both energetic disorder and Coulomb correlations. The correlations are treated exactly up to the third-order in the field. Energetic disorder is taken from random distribution functions, over which the optical response is averaged. Analysis show that the disorder-induced dephasing is the result of a destructive interference which requires the treatment of Coulomb correlations in the presence of disorder. The estimated ratio of the decay times for the two configurations is in good agreement with experiments performed on a variety of quantum well samples.

Original languageEnglish (US)
Title of host publicationIQEC, International Quantum Electronics Conference Proceedings
PublisherIEEE
StatePublished - 2000
Externally publishedYes
Event2000 International Quantum Electronics Conference (IQEC 2000) - Nice, France
Duration: Sep 10 2000Sep 15 2000

Other

Other2000 International Quantum Electronics Conference (IQEC 2000)
CityNice, France
Period9/10/009/15/00

Fingerprint

disorders
decay
statistical distributions
four-wave mixing
distribution functions
quantum wells
interference
polarization
configurations

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Weiser, S., Meier, T., Moebius, J., Euteneuer, A., Mayer, E. J., Stolz, W., ... Koch, S. W. (2000). Analysis of disorder-induced dephasing. In IQEC, International Quantum Electronics Conference Proceedings IEEE.

Analysis of disorder-induced dephasing. / Weiser, S.; Meier, T.; Moebius, J.; Euteneuer, A.; Mayer, E. J.; Stolz, W.; Hofmann, M.; Ruehle, W. W.; Thomas, P.; Koch, Stephan W.

IQEC, International Quantum Electronics Conference Proceedings. IEEE, 2000.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Weiser, S, Meier, T, Moebius, J, Euteneuer, A, Mayer, EJ, Stolz, W, Hofmann, M, Ruehle, WW, Thomas, P & Koch, SW 2000, Analysis of disorder-induced dephasing. in IQEC, International Quantum Electronics Conference Proceedings. IEEE, 2000 International Quantum Electronics Conference (IQEC 2000), Nice, France, 9/10/00.
Weiser S, Meier T, Moebius J, Euteneuer A, Mayer EJ, Stolz W et al. Analysis of disorder-induced dephasing. In IQEC, International Quantum Electronics Conference Proceedings. IEEE. 2000
Weiser, S. ; Meier, T. ; Moebius, J. ; Euteneuer, A. ; Mayer, E. J. ; Stolz, W. ; Hofmann, M. ; Ruehle, W. W. ; Thomas, P. ; Koch, Stephan W. / Analysis of disorder-induced dephasing. IQEC, International Quantum Electronics Conference Proceedings. IEEE, 2000.
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AU - Hofmann, M.

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