Analysis of microgram amounts of particulate material by simultaneous multiwavelength AES

Robert S. Pomeroy, Jeffrey D. Kolczynski, Jonathan V. Sweedler, M. Bonner Denton

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

A unique simultaneous emission spectrograph is utilized to perform qualitative and quantitative analysis on trace quantities of solid particulates. The atomic emission spectroscopic system consists of a direct current plasma source and an echelle spectrograph with a charge injection device detector, enabling the system to simultaneously measure the wavelength range from 220 nm to 520 nm with 0.02 nm resolution at 300 nm. Monitoring all wavelengths simultaneously allows the qualitative and quantitative determination of most major and minor constituent in a trace quantity of sample with little prior knowledge about the sample. The ability to perform qualitative and quantitative analysis on particulates is demonstrated by evaluating NBS certified coal fly ash, as well as a sample taken from the respirator air filter at an acute care unit in a hospital.

Original languageEnglish (US)
Pages (from-to)347-353
Number of pages7
JournalMikrochimica Acta
Volume99
Issue number3-6
DOIs
StatePublished - May 1 1989

Keywords

  • CID detection
  • atomic emission spectroscopy
  • charge transfer device
  • trace elemental analysis

ASJC Scopus subject areas

  • Analytical Chemistry

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