Analysis of multilayer thin-film structures containing magneto-optic and anisotropic media at oblique incidence using 2×2 matrices

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155 Scopus citations

Abstract

A complete analysis of multilayer structures containing an arbitrary number of dielectric, metal, magnetic, and birefringent/dichroic layers is presented. An algorithm, based on simple 2×2 matrices, is derived which allows reflection, transmission, absorption, magneto-optic conversion, birefringence, and dichroism of the structure to be computed on a personal computer. The incident beam is assumed to be plane monochromatic with arbitrary angle of incidence. There are no approximations involved, and the results are direct consequences of Maxwell's equations.

Original languageEnglish (US)
Pages (from-to)6466-6475
Number of pages10
JournalJournal of Applied Physics
Volume67
Issue number10
DOIs
StatePublished - Dec 1 1990

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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