Analysis of spatial pseudodepolarizers in imaging systems

James P. McGuire, Russell A Chipman

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The objective of a number of optical instruments is to measure the intensity accurately without bias to incident polarization state. One method to overcome polarization bias in optical systems is the insertion of a spatial pseudodepolarizer. Both the degree of pseudodepolarization and image degradation (from the polarization aberrations of the pseudodepolarizer) are analyzed for two depolarizer designs: the Cornu pseudodepolarizer effective for linearly polarized light and the dual Babinet compensator pseudodepolarizer effective for all incident polarization states. The image analysis uses the matrix formalism presented in a previous paper (“Diffraction image formation and analysis in optical systems with polarization aberrations I: Formulation and example”) to describe the polarization dependence of the the diffraction patterns and optical transfer function.

Original languageEnglish (US)
Pages (from-to)95-108
Number of pages14
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1166
DOIs
StatePublished - Jan 25 1990
Externally publishedYes

ASJC Scopus subject areas

  • Applied Mathematics
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Computer Science Applications

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