Analyzing sub-100-μm samples with transmission terahertz time domain spectroscopy

Maik A Scheller, Christian Jansen, Martin Koch

Research output: Contribution to journalArticle

136 Citations (Scopus)

Abstract

The authors propose a method for the extraction of material parameter and thickness information from sub-100-μm thin samples using non-differential transmission terahertz time domain spectroscopy. The approach relies on an additional Fourier transform of the frequency dependent material parameters to a quasi space regime. In this quasi space, periodic Fabry-Perot oscillations from the frequency domain, which originate from multiple reflections inside the sample, correspond to discrete peaks. By iterative minimization of these peaks, the highly precise thickness information along with the refractive index and absorption coefficient of the sample can be determined. Experimental verification of the approach is also provided.

Original languageEnglish (US)
Pages (from-to)1304-1306
Number of pages3
JournalOptics Communications
Volume282
Issue number7
DOIs
StatePublished - Apr 1 2009
Externally publishedYes

Fingerprint

Spectroscopy
spectroscopy
Refractive index
Fourier transforms
absorptivity
refractivity
oscillations
optimization
coefficients

Keywords

  • Fabry-Perot
  • Quasi space
  • Spectrum analysis
  • Terahertz spectroscopy
  • Thickness determination

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry

Cite this

Analyzing sub-100-μm samples with transmission terahertz time domain spectroscopy. / Scheller, Maik A; Jansen, Christian; Koch, Martin.

In: Optics Communications, Vol. 282, No. 7, 01.04.2009, p. 1304-1306.

Research output: Contribution to journalArticle

Scheller, Maik A ; Jansen, Christian ; Koch, Martin. / Analyzing sub-100-μm samples with transmission terahertz time domain spectroscopy. In: Optics Communications. 2009 ; Vol. 282, No. 7. pp. 1304-1306.
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