Angle-resolved entanglement spectroscopy for semiconductor applications

W. Hoyer, P. Bozsoki, M. Kira, P. Thomas, Stephan W Koch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Angle and energy resolved single-photon correlation measurements of luminescence emitted from semiconductor nanostructures are modeled. A simple reconstruction procedure is shown to yield the long-range disorder fluctuations with high fidelity.

Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics, 2007, CLEO 2007
DOIs
StatePublished - 2007
Externally publishedYes
EventConference on Lasers and Electro-Optics, 2007, CLEO 2007 - Baltimore, MD, United States
Duration: May 6 2007May 11 2007

Other

OtherConference on Lasers and Electro-Optics, 2007, CLEO 2007
CountryUnited States
CityBaltimore, MD
Period5/6/075/11/07

Fingerprint

Luminescence
Nanostructures
Photons
Spectroscopy
Semiconductor materials

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Hoyer, W., Bozsoki, P., Kira, M., Thomas, P., & Koch, S. W. (2007). Angle-resolved entanglement spectroscopy for semiconductor applications. In Conference on Lasers and Electro-Optics, 2007, CLEO 2007 [4452598] https://doi.org/10.1109/CLEO.2007.4452598

Angle-resolved entanglement spectroscopy for semiconductor applications. / Hoyer, W.; Bozsoki, P.; Kira, M.; Thomas, P.; Koch, Stephan W.

Conference on Lasers and Electro-Optics, 2007, CLEO 2007. 2007. 4452598.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hoyer, W, Bozsoki, P, Kira, M, Thomas, P & Koch, SW 2007, Angle-resolved entanglement spectroscopy for semiconductor applications. in Conference on Lasers and Electro-Optics, 2007, CLEO 2007., 4452598, Conference on Lasers and Electro-Optics, 2007, CLEO 2007, Baltimore, MD, United States, 5/6/07. https://doi.org/10.1109/CLEO.2007.4452598
Hoyer W, Bozsoki P, Kira M, Thomas P, Koch SW. Angle-resolved entanglement spectroscopy for semiconductor applications. In Conference on Lasers and Electro-Optics, 2007, CLEO 2007. 2007. 4452598 https://doi.org/10.1109/CLEO.2007.4452598
Hoyer, W. ; Bozsoki, P. ; Kira, M. ; Thomas, P. ; Koch, Stephan W. / Angle-resolved entanglement spectroscopy for semiconductor applications. Conference on Lasers and Electro-Optics, 2007, CLEO 2007. 2007.
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