Angle-resolved entanglement spectroscopy for semiconductor applications

W. Hoyer, P. Bozsoki, M. Kira, P. Thomas, S. W. Koch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Angle and energy resolved single-photon correlation measurements of luminescence emitted from semiconductor nanostructures are modeled. A simple reconstruction procedure is shown to yield the long-range disorder fluctuations with high fidelity.

Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics, 2007, CLEO 2007
DOIs
StatePublished - Dec 1 2007
EventConference on Lasers and Electro-Optics, 2007, CLEO 2007 - Baltimore, MD, United States
Duration: May 6 2007May 11 2007

Publication series

NameConference on Lasers and Electro-Optics, 2007, CLEO 2007

Other

OtherConference on Lasers and Electro-Optics, 2007, CLEO 2007
CountryUnited States
CityBaltimore, MD
Period5/6/075/11/07

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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    Hoyer, W., Bozsoki, P., Kira, M., Thomas, P., & Koch, S. W. (2007). Angle-resolved entanglement spectroscopy for semiconductor applications. In Conference on Lasers and Electro-Optics, 2007, CLEO 2007 [4452598] (Conference on Lasers and Electro-Optics, 2007, CLEO 2007). https://doi.org/10.1109/CLEO.2007.4452598