Angle-resolved entanglement spectroscopy for semiconductor applications

W. Hoyer, P. Bozsoki, M. Kira, P. Thomas, Stephan W Koch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Angle and energy resolved single-photon correlation measurements of luminescence emitted from semiconductor nanostructures are modeled. A simple reconstruction procedure is shown to yield the long-range disorder fluctuations with high fidelity.

Original languageEnglish (US)
Title of host publicationOptics InfoBase Conference Papers
PublisherOptical Society of America
ISBN (Print)1557528349, 9781557528346
StatePublished - 2007
Externally publishedYes
EventConference on Lasers and Electro-Optics, CLEO 2007 - Baltimore, MD, United States
Duration: May 6 2007May 6 2007

Other

OtherConference on Lasers and Electro-Optics, CLEO 2007
CountryUnited States
CityBaltimore, MD
Period5/6/075/6/07

Fingerprint

Luminescence
Nanostructures
Photons
Spectroscopy
disorders
luminescence
Semiconductor materials
photons
spectroscopy
energy

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Hoyer, W., Bozsoki, P., Kira, M., Thomas, P., & Koch, S. W. (2007). Angle-resolved entanglement spectroscopy for semiconductor applications. In Optics InfoBase Conference Papers Optical Society of America.

Angle-resolved entanglement spectroscopy for semiconductor applications. / Hoyer, W.; Bozsoki, P.; Kira, M.; Thomas, P.; Koch, Stephan W.

Optics InfoBase Conference Papers. Optical Society of America, 2007.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hoyer, W, Bozsoki, P, Kira, M, Thomas, P & Koch, SW 2007, Angle-resolved entanglement spectroscopy for semiconductor applications. in Optics InfoBase Conference Papers. Optical Society of America, Conference on Lasers and Electro-Optics, CLEO 2007, Baltimore, MD, United States, 5/6/07.
Hoyer W, Bozsoki P, Kira M, Thomas P, Koch SW. Angle-resolved entanglement spectroscopy for semiconductor applications. In Optics InfoBase Conference Papers. Optical Society of America. 2007
Hoyer, W. ; Bozsoki, P. ; Kira, M. ; Thomas, P. ; Koch, Stephan W. / Angle-resolved entanglement spectroscopy for semiconductor applications. Optics InfoBase Conference Papers. Optical Society of America, 2007.
@inproceedings{f08e533c965d4d9392ce613af144b090,
title = "Angle-resolved entanglement spectroscopy for semiconductor applications",
abstract = "Angle and energy resolved single-photon correlation measurements of luminescence emitted from semiconductor nanostructures are modeled. A simple reconstruction procedure is shown to yield the long-range disorder fluctuations with high fidelity.",
author = "W. Hoyer and P. Bozsoki and M. Kira and P. Thomas and Koch, {Stephan W}",
year = "2007",
language = "English (US)",
isbn = "1557528349",
booktitle = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America",

}

TY - GEN

T1 - Angle-resolved entanglement spectroscopy for semiconductor applications

AU - Hoyer, W.

AU - Bozsoki, P.

AU - Kira, M.

AU - Thomas, P.

AU - Koch, Stephan W

PY - 2007

Y1 - 2007

N2 - Angle and energy resolved single-photon correlation measurements of luminescence emitted from semiconductor nanostructures are modeled. A simple reconstruction procedure is shown to yield the long-range disorder fluctuations with high fidelity.

AB - Angle and energy resolved single-photon correlation measurements of luminescence emitted from semiconductor nanostructures are modeled. A simple reconstruction procedure is shown to yield the long-range disorder fluctuations with high fidelity.

UR - http://www.scopus.com/inward/record.url?scp=84899009031&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84899009031&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84899009031

SN - 1557528349

SN - 9781557528346

BT - Optics InfoBase Conference Papers

PB - Optical Society of America

ER -