Angle-resolved entanglement spectroscopy for semiconductor applications

W. Hoyer, P. Bozsoki, M. Kira, P. Thomas, S. W. Koch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Angle and energy resolved single-photon correlation measurements of luminescence emitted from semiconductor nanostructures are modeled. A simple reconstruction procedure is shown to yield the long-range disorder fluctuations with high fidelity.

Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2007
PublisherOptical Society of America
ISBN (Print)1557528349, 9781557528346
StatePublished - Jan 1 2007
EventConference on Lasers and Electro-Optics, CLEO 2007 - Baltimore, MD, United States
Duration: May 6 2007May 6 2007

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherConference on Lasers and Electro-Optics, CLEO 2007
CountryUnited States
CityBaltimore, MD
Period5/6/075/6/07

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Hoyer, W., Bozsoki, P., Kira, M., Thomas, P., & Koch, S. W. (2007). Angle-resolved entanglement spectroscopy for semiconductor applications. In Conference on Lasers and Electro-Optics, CLEO 2007 (Optics InfoBase Conference Papers). Optical Society of America.