A novel method for near-field optical microscopy was demonstrated based on detecting the modulation in the electric field of the scattered wave from the tip caused by the sample. The technique developed was called apertureless near-field optical microscopy. The basic concept of the technique incorporated a Sharp silicon tip of an atomic force microscope cantilever which can provide spherical light scattering defining the light source. Although the initial results showed images with feature sizes in the three manometer range, it was believed that these results could be significantly improved with careful instrument design.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)