Apertureless near-field optical microscope

Frederic Zenhausern, M. P. O'Boyle, H. K. Wickramasinghe

Research output: Contribution to journalArticle

484 Citations (Scopus)

Abstract

A novel method for near-field optical microscopy was demonstrated based on detecting the modulation in the electric field of the scattered wave from the tip caused by the sample. The technique developed was called apertureless near-field optical microscopy. The basic concept of the technique incorporated a Sharp silicon tip of an atomic force microscope cantilever which can provide spherical light scattering defining the light source. Although the initial results showed images with feature sizes in the three manometer range, it was believed that these results could be significantly improved with careful instrument design.

Original languageEnglish (US)
Pages (from-to)1623-1625
Number of pages3
JournalApplied Physics Letters
Volume65
Issue number13
DOIs
StatePublished - Jan 1 1994
Externally publishedYes

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optical microscopes
near fields
microscopy
manometers
light sources
light scattering
microscopes
modulation
electric fields
silicon

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Apertureless near-field optical microscope. / Zenhausern, Frederic; O'Boyle, M. P.; Wickramasinghe, H. K.

In: Applied Physics Letters, Vol. 65, No. 13, 01.01.1994, p. 1623-1625.

Research output: Contribution to journalArticle

Zenhausern, F, O'Boyle, MP & Wickramasinghe, HK 1994, 'Apertureless near-field optical microscope', Applied Physics Letters, vol. 65, no. 13, pp. 1623-1625. https://doi.org/10.1063/1.112931
Zenhausern, Frederic ; O'Boyle, M. P. ; Wickramasinghe, H. K. / Apertureless near-field optical microscope. In: Applied Physics Letters. 1994 ; Vol. 65, No. 13. pp. 1623-1625.
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