Application of a synthetic extended source for interferometry

Sophie Morel, Matthew B Dubin, Joe Shiefman, James H Burge

Research output: Contribution to journalArticle

Abstract

This paper presents the design of a synthetic extended source (SES) that reduces coherent noise in interferometric measurements. The SES uses a fully coherent source for data acquisition to preserve highcontrast interferograms. Multiple measurements are made while the point source is translated according to a prescribed trajectory. The average of the measurements has the effect of using a source with a distribution defined by the trajectory. Thus, the optical system uses a coherent point source, but the data combination synthesizes the behavior of an extended source. A parametric model to quantify measurement noise due to diffraction from small particles is developed and used to evaluate SES designs. Experimental results are shown that validate the modeling. An example of a practical working SES implemented in a custom SPSI interferometer is provided.

Original languageEnglish (US)
Pages (from-to)7903-7915
Number of pages13
JournalApplied Optics
Volume53
Issue number33
DOIs
StatePublished - Nov 20 2014

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Interferometry
interferometry
Trajectories
point sources
trajectories
Optical systems
Interferometers
coherent sources
Data acquisition
Diffraction
noise measurement
data acquisition
interferometers
diffraction

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Application of a synthetic extended source for interferometry. / Morel, Sophie; Dubin, Matthew B; Shiefman, Joe; Burge, James H.

In: Applied Optics, Vol. 53, No. 33, 20.11.2014, p. 7903-7915.

Research output: Contribution to journalArticle

Morel, Sophie ; Dubin, Matthew B ; Shiefman, Joe ; Burge, James H. / Application of a synthetic extended source for interferometry. In: Applied Optics. 2014 ; Vol. 53, No. 33. pp. 7903-7915.
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