Application of bispectrum analysis to infrared speckle data

Julian C. Christou, Jonathan D. Freeman, Francois Roddier, Donald W Mccarthy, Michael L. Cobb, Stuart B. Shaklan

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We have applied the bispectrum algorithm to one-dimensional infrared speckle data for retrieval of diffraction limited phases. We use a standard weighting averaging technique to combine the multiple phase estimates contained in the bispectrum. We have also used the bispectrum modulus to obtain visibility amplitudes. Results, including images, are presented for three different binary stars. Simulated data has also been used to study the behaviour of the algorithm under different signal-to-noise conditions as well as a study of phase recovery for different defocus conditions. We find that the algorithm is sensitive, at a low level, to focus changes especially for noisy data. Comparison of the bispectrum phases is made with those obtained from Knox-Thompson cross-spectra for all cases.

Original languageEnglish (US)
Pages (from-to)32-39
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume828
DOIs
StatePublished - Jan 29 1988

Fingerprint

Bispectrum
Speckle
Infrared
Infrared radiation
binary stars
visibility
Visibility
Averaging Technique
Defocus
Stars
retrieval
Noisy Data
Diffraction
recovery
Weighting
Recovery
Star
Modulus
Retrieval
estimates

ASJC Scopus subject areas

  • Applied Mathematics
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Computer Science Applications

Cite this

Application of bispectrum analysis to infrared speckle data. / Christou, Julian C.; Freeman, Jonathan D.; Roddier, Francois; Mccarthy, Donald W; Cobb, Michael L.; Shaklan, Stuart B.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 828, 29.01.1988, p. 32-39.

Research output: Contribution to journalArticle

Christou, Julian C. ; Freeman, Jonathan D. ; Roddier, Francois ; Mccarthy, Donald W ; Cobb, Michael L. ; Shaklan, Stuart B. / Application of bispectrum analysis to infrared speckle data. In: Proceedings of SPIE - The International Society for Optical Engineering. 1988 ; Vol. 828. pp. 32-39.
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