Application of maximum-likelihood estimation in optical coherence tomography for nanometer-class thickness estimation

Jinxin Huang, Qun Yuan, Patrice Tankam, Eric W Clarkson, Matthew A Kupinski, Holly B. Hindman, James V. Aquavella, Jannick P. Rolland

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In biophotonics imaging, one important and quantitative task is layer-thickness estimation. In this study, we investigate the approach of combining optical coherence tomography and a maximum-likelihood (ML) estimator for layer thickness estimation in the context of tear film imaging. The motivation of this study is to extend our understanding of tear film dynamics, which is the prerequisite to advance the management of Dry Eye Disease, through the simultaneous estimation of the thickness of the tear film lipid and aqueous layers. The estimator takes into account the different statistical processes associated with the imaging chain. We theoretically investigated the impact of key system parameters, such as the axial point spread functions (PSF) and various sources of noise on measurement uncertainty. Simulations show that an OCT system with a 1 μm axial PSF (FWHM) allows unbiased estimates down to nanometers with nanometer precision. In implementation, we built a customized Fourier domain OCT system that operates in the 600 to 1000 nm spectral window and achieves 0.93 micron axial PSF in corneal epithelium. We then validated the theoretical framework with physical phantoms made of custom optical coatings, with layer thicknesses from tens of nanometers to microns. Results demonstrate unbiased nanometer-class thickness estimates in three different physical phantoms.

Original languageEnglish (US)
Title of host publicationProgress in Biomedical Optics and Imaging - Proceedings of SPIE
PublisherSPIE
Volume9315
ISBN (Print)9781628414059
DOIs
StatePublished - 2015
EventDesign and Quality for Biomedical Technologies VIII - San Francisco, United States
Duration: Feb 7 2015Feb 8 2015

Other

OtherDesign and Quality for Biomedical Technologies VIII
CountryUnited States
CitySan Francisco
Period2/7/152/8/15

Fingerprint

Maximum likelihood estimation
Optical tomography
Optical transfer function
Optical Coherence Tomography
Tears
tomography
Imaging techniques
point spread functions
Optical coatings
Corneal Epithelium
Eye Diseases
estimators
Full width at half maximum
eye diseases
Lipids
Maximum likelihood
Uncertainty
Noise
optical coatings
epithelium

Keywords

  • Coherence and statistical optics
  • Optical coherence tomography
  • Optical instrumentation
  • Task-based assessment

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Radiology Nuclear Medicine and imaging

Cite this

Huang, J., Yuan, Q., Tankam, P., Clarkson, E. W., Kupinski, M. A., Hindman, H. B., ... Rolland, J. P. (2015). Application of maximum-likelihood estimation in optical coherence tomography for nanometer-class thickness estimation. In Progress in Biomedical Optics and Imaging - Proceedings of SPIE (Vol. 9315). [93150F] SPIE. https://doi.org/10.1117/12.2083160

Application of maximum-likelihood estimation in optical coherence tomography for nanometer-class thickness estimation. / Huang, Jinxin; Yuan, Qun; Tankam, Patrice; Clarkson, Eric W; Kupinski, Matthew A; Hindman, Holly B.; Aquavella, James V.; Rolland, Jannick P.

Progress in Biomedical Optics and Imaging - Proceedings of SPIE. Vol. 9315 SPIE, 2015. 93150F.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Huang, J, Yuan, Q, Tankam, P, Clarkson, EW, Kupinski, MA, Hindman, HB, Aquavella, JV & Rolland, JP 2015, Application of maximum-likelihood estimation in optical coherence tomography for nanometer-class thickness estimation. in Progress in Biomedical Optics and Imaging - Proceedings of SPIE. vol. 9315, 93150F, SPIE, Design and Quality for Biomedical Technologies VIII, San Francisco, United States, 2/7/15. https://doi.org/10.1117/12.2083160
Huang J, Yuan Q, Tankam P, Clarkson EW, Kupinski MA, Hindman HB et al. Application of maximum-likelihood estimation in optical coherence tomography for nanometer-class thickness estimation. In Progress in Biomedical Optics and Imaging - Proceedings of SPIE. Vol. 9315. SPIE. 2015. 93150F https://doi.org/10.1117/12.2083160
Huang, Jinxin ; Yuan, Qun ; Tankam, Patrice ; Clarkson, Eric W ; Kupinski, Matthew A ; Hindman, Holly B. ; Aquavella, James V. ; Rolland, Jannick P. / Application of maximum-likelihood estimation in optical coherence tomography for nanometer-class thickness estimation. Progress in Biomedical Optics and Imaging - Proceedings of SPIE. Vol. 9315 SPIE, 2015.
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