Application of maximum-likelihood estimation in optical coherence tomography for nanometer-class thickness estimation

Jinxin Huang, Qun Yuan, Patrice Tankam, Eric Clarkson, Matthew Kupinski, Holly B. Hindman, James V. Aquavella, Jannick P. Rolland

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In biophotonics imaging, one important and quantitative task is layer-thickness estimation. In this study, we investigate the approach of combining optical coherence tomography and a maximum-likelihood (ML) estimator for layer thickness estimation in the context of tear film imaging. The motivation of this study is to extend our understanding of tear film dynamics, which is the prerequisite to advance the management of Dry Eye Disease, through the simultaneous estimation of the thickness of the tear film lipid and aqueous layers. The estimator takes into account the different statistical processes associated with the imaging chain. We theoretically investigated the impact of key system parameters, such as the axial point spread functions (PSF) and various sources of noise on measurement uncertainty. Simulations show that an OCT system with a 1 μm axial PSF (FWHM) allows unbiased estimates down to nanometers with nanometer precision. In implementation, we built a customized Fourier domain OCT system that operates in the 600 to 1000 nm spectral window and achieves 0.93 micron axial PSF in corneal epithelium. We then validated the theoretical framework with physical phantoms made of custom optical coatings, with layer thicknesses from tens of nanometers to microns. Results demonstrate unbiased nanometer-class thickness estimates in three different physical phantoms.

Original languageEnglish (US)
Title of host publicationDesign and Quality for Biomedical Technologies VIII
EditorsRongguang Liang, Ramesh Raghavachari
PublisherSPIE
ISBN (Electronic)9781628414059
DOIs
StatePublished - Jan 1 2015
EventDesign and Quality for Biomedical Technologies VIII - San Francisco, United States
Duration: Feb 7 2015Feb 8 2015

Publication series

NameProgress in Biomedical Optics and Imaging - Proceedings of SPIE
Volume9315
ISSN (Print)1605-7422

Other

OtherDesign and Quality for Biomedical Technologies VIII
CountryUnited States
CitySan Francisco
Period2/7/152/8/15

Keywords

  • Coherence and statistical optics
  • Optical coherence tomography
  • Optical instrumentation
  • Task-based assessment

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Atomic and Molecular Physics, and Optics
  • Radiology Nuclear Medicine and imaging

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  • Cite this

    Huang, J., Yuan, Q., Tankam, P., Clarkson, E., Kupinski, M., Hindman, H. B., Aquavella, J. V., & Rolland, J. P. (2015). Application of maximum-likelihood estimation in optical coherence tomography for nanometer-class thickness estimation. In R. Liang, & R. Raghavachari (Eds.), Design and Quality for Biomedical Technologies VIII [93150F] (Progress in Biomedical Optics and Imaging - Proceedings of SPIE; Vol. 9315). SPIE. https://doi.org/10.1117/12.2083160