Applying a microfacet model to polarized light scattering measurements of the Earth's surface

Meridith Kathryn Kupinski, Christine Bradley, David Diner, Feng Xu, Russell A Chipman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

Representative examples from three-years of measurements from JPL's Ground-based Multiangle SpectroPolarimetric Imager (Ground-MSPI)[1] are compared to a model for the surface polarized bidirectional reflectance distribution matrix (BRDM). Ground-MSPI is an eight-band spectropolarimetric camera mounted on a rotating gimbal to acquire push-broom imagery of outdoor landscapes. The camera uses a photoelastic-modulator-based polarimetric imaging technique to measure linear Stokes parameters in three wavebands (470, 660, and 865 nm) with a ±0.005 uncertainty in degree of linear polarization (DoLP). Comparisons between MSPI measurements, BRDM models, and common modifications to the model are made over a range of scattering angles determined from a fixed viewing geometry and varying sun positions over time. The BRDM model is comprised of a volumetric reflection term plus a specular reflection term of Fresnel-reflecting micro-facets. We consider modifications to this model using a shadowing function and two different micro-facet scattering density functions. We report the root-mean-square error (RMSE) between the Ground-MSPI measurements and BRDM model. The BRDM model predicts an angle of the linear polarization (AoLP) that is perpendicular to the scattering plane. This is usually, but not always, observed in Ground-MSPI measurements and in this work we offer explanations for some of the deviations from the model.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9613
ISBN (Print)9781628417791
DOIs
StatePublished - 2015
EventPolarization Science and Remote Sensing VII - San Diego, United States
Duration: Aug 11 2015Aug 12 2015

Other

OtherPolarization Science and Remote Sensing VII
CountryUnited States
CitySan Diego
Period8/11/158/12/15

Fingerprint

Light Scattering
Earth surface
Light polarization
Reflectance
Light scattering
polarized light
Matrix Models
Imager
bidirectional reflectance
light scattering
Earth (planet)
Image sensors
Scattering
Facet
matrices
Polarization
Camera
Angle
linear polarization
Model

Keywords

  • Bidirectional Polarized reectance Distribution Function (BPDF)
  • Bidirectional Reectance Distribution Matrix (BRDM)
  • Land surface
  • Multiangle SpectroPolarimetric Imager (MSPI)
  • p-BRDF
  • polarized light scattering
  • reection models

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Kupinski, M. K., Bradley, C., Diner, D., Xu, F., & Chipman, R. A. (2015). Applying a microfacet model to polarized light scattering measurements of the Earth's surface. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9613). [96130T] SPIE. https://doi.org/10.1117/12.2188207

Applying a microfacet model to polarized light scattering measurements of the Earth's surface. / Kupinski, Meridith Kathryn; Bradley, Christine; Diner, David; Xu, Feng; Chipman, Russell A.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9613 SPIE, 2015. 96130T.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kupinski, MK, Bradley, C, Diner, D, Xu, F & Chipman, RA 2015, Applying a microfacet model to polarized light scattering measurements of the Earth's surface. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 9613, 96130T, SPIE, Polarization Science and Remote Sensing VII, San Diego, United States, 8/11/15. https://doi.org/10.1117/12.2188207
Kupinski MK, Bradley C, Diner D, Xu F, Chipman RA. Applying a microfacet model to polarized light scattering measurements of the Earth's surface. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9613. SPIE. 2015. 96130T https://doi.org/10.1117/12.2188207
Kupinski, Meridith Kathryn ; Bradley, Christine ; Diner, David ; Xu, Feng ; Chipman, Russell A. / Applying a microfacet model to polarized light scattering measurements of the Earth's surface. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9613 SPIE, 2015.
@inproceedings{bfcf8b86973f4f77bbc6aba257100b3d,
title = "Applying a microfacet model to polarized light scattering measurements of the Earth's surface",
abstract = "Representative examples from three-years of measurements from JPL's Ground-based Multiangle SpectroPolarimetric Imager (Ground-MSPI)[1] are compared to a model for the surface polarized bidirectional reflectance distribution matrix (BRDM). Ground-MSPI is an eight-band spectropolarimetric camera mounted on a rotating gimbal to acquire push-broom imagery of outdoor landscapes. The camera uses a photoelastic-modulator-based polarimetric imaging technique to measure linear Stokes parameters in three wavebands (470, 660, and 865 nm) with a ±0.005 uncertainty in degree of linear polarization (DoLP). Comparisons between MSPI measurements, BRDM models, and common modifications to the model are made over a range of scattering angles determined from a fixed viewing geometry and varying sun positions over time. The BRDM model is comprised of a volumetric reflection term plus a specular reflection term of Fresnel-reflecting micro-facets. We consider modifications to this model using a shadowing function and two different micro-facet scattering density functions. We report the root-mean-square error (RMSE) between the Ground-MSPI measurements and BRDM model. The BRDM model predicts an angle of the linear polarization (AoLP) that is perpendicular to the scattering plane. This is usually, but not always, observed in Ground-MSPI measurements and in this work we offer explanations for some of the deviations from the model.",
keywords = "Bidirectional Polarized reectance Distribution Function (BPDF), Bidirectional Reectance Distribution Matrix (BRDM), Land surface, Multiangle SpectroPolarimetric Imager (MSPI), p-BRDF, polarized light scattering, reection models",
author = "Kupinski, {Meridith Kathryn} and Christine Bradley and David Diner and Feng Xu and Chipman, {Russell A}",
year = "2015",
doi = "10.1117/12.2188207",
language = "English (US)",
isbn = "9781628417791",
volume = "9613",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",

}

TY - GEN

T1 - Applying a microfacet model to polarized light scattering measurements of the Earth's surface

AU - Kupinski, Meridith Kathryn

AU - Bradley, Christine

AU - Diner, David

AU - Xu, Feng

AU - Chipman, Russell A

PY - 2015

Y1 - 2015

N2 - Representative examples from three-years of measurements from JPL's Ground-based Multiangle SpectroPolarimetric Imager (Ground-MSPI)[1] are compared to a model for the surface polarized bidirectional reflectance distribution matrix (BRDM). Ground-MSPI is an eight-band spectropolarimetric camera mounted on a rotating gimbal to acquire push-broom imagery of outdoor landscapes. The camera uses a photoelastic-modulator-based polarimetric imaging technique to measure linear Stokes parameters in three wavebands (470, 660, and 865 nm) with a ±0.005 uncertainty in degree of linear polarization (DoLP). Comparisons between MSPI measurements, BRDM models, and common modifications to the model are made over a range of scattering angles determined from a fixed viewing geometry and varying sun positions over time. The BRDM model is comprised of a volumetric reflection term plus a specular reflection term of Fresnel-reflecting micro-facets. We consider modifications to this model using a shadowing function and two different micro-facet scattering density functions. We report the root-mean-square error (RMSE) between the Ground-MSPI measurements and BRDM model. The BRDM model predicts an angle of the linear polarization (AoLP) that is perpendicular to the scattering plane. This is usually, but not always, observed in Ground-MSPI measurements and in this work we offer explanations for some of the deviations from the model.

AB - Representative examples from three-years of measurements from JPL's Ground-based Multiangle SpectroPolarimetric Imager (Ground-MSPI)[1] are compared to a model for the surface polarized bidirectional reflectance distribution matrix (BRDM). Ground-MSPI is an eight-band spectropolarimetric camera mounted on a rotating gimbal to acquire push-broom imagery of outdoor landscapes. The camera uses a photoelastic-modulator-based polarimetric imaging technique to measure linear Stokes parameters in three wavebands (470, 660, and 865 nm) with a ±0.005 uncertainty in degree of linear polarization (DoLP). Comparisons between MSPI measurements, BRDM models, and common modifications to the model are made over a range of scattering angles determined from a fixed viewing geometry and varying sun positions over time. The BRDM model is comprised of a volumetric reflection term plus a specular reflection term of Fresnel-reflecting micro-facets. We consider modifications to this model using a shadowing function and two different micro-facet scattering density functions. We report the root-mean-square error (RMSE) between the Ground-MSPI measurements and BRDM model. The BRDM model predicts an angle of the linear polarization (AoLP) that is perpendicular to the scattering plane. This is usually, but not always, observed in Ground-MSPI measurements and in this work we offer explanations for some of the deviations from the model.

KW - Bidirectional Polarized reectance Distribution Function (BPDF)

KW - Bidirectional Reectance Distribution Matrix (BRDM)

KW - Land surface

KW - Multiangle SpectroPolarimetric Imager (MSPI)

KW - p-BRDF

KW - polarized light scattering

KW - reection models

UR - http://www.scopus.com/inward/record.url?scp=84960840043&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84960840043&partnerID=8YFLogxK

U2 - 10.1117/12.2188207

DO - 10.1117/12.2188207

M3 - Conference contribution

AN - SCOPUS:84960840043

SN - 9781628417791

VL - 9613

BT - Proceedings of SPIE - The International Society for Optical Engineering

PB - SPIE

ER -