|Original language||English (US)|
|Number of pages||3|
|State||Published - Dec 1 1998|
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
Romero, J. D., Jeon, J. S., Hossain, T., Li, G., & Raghavan, S. (1998). Atomic Force Microscopy Analysis of Rough Si Surfaces Induced by Copper Contamination in HF and BHF Solutions. Scanning, 20(3), 165-167.