Atomic-layer expulsion in nanoindentations on an ionic single crystal

P. F.M. Terán Arce, G. Andreu Riera, P. Gorostiza, F. Sanz

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

Utilizing atomic-force microscopy, we have performed and characterized nanoindentations on a MgO(100) surface with depths varying between one monatomic layer and tens of nm. Our results show that plastic deformation is indicated by discrete events in the indentation curve which are associated with the number of atomic layers being expelled by the tip penetrating the surface. An estimation of the energy required to expel MgO ions from a monatomic deep cavity correlates well with our data. The critical shear strength was evaluated and lies in the same order of magnitude as the theoretical value.

Original languageEnglish (US)
Pages (from-to)839-841
Number of pages3
JournalApplied Physics Letters
Volume77
Issue number6
DOIs
StatePublished - Aug 7 2000
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Atomic-layer expulsion in nanoindentations on an ionic single crystal'. Together they form a unique fingerprint.

Cite this