Automating test generation for discrete event oriented embedded systems

Steven J. Cunning, Jerzy W Rozenblit

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A method for the automatic generation of test scenarios from the behavioral requirements of a system is presented in this paper. The generated suite of test scenarios validates the system design or implementation against the requirements. The approach proposed here uses a requirements model and a set of four algorithms. The requirements model is an executable model of the proposed system defined in a deterministic state-based modeling formalism. Each action in the requirements model that changes the state of the model is identified with a unique requirement identifier. The scenario generation algorithms perform controlled simulations of the requirements model in order to generate a suite of test scenarios applicable for black box testing. Measurements of several metrics on the scenario generation algorithms have been collected using prototype tools.

Original languageEnglish (US)
Pages (from-to)87-112
Number of pages26
JournalJournal of Intelligent and Robotic Systems: Theory and Applications
Volume41
Issue number2-3
DOIs
StatePublished - Jan 2005

Fingerprint

Embedded systems
Black-box testing
Systems analysis

Keywords

  • Embedded systems
  • Requirements modeling
  • Test pattern generation

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Artificial Intelligence

Cite this

Automating test generation for discrete event oriented embedded systems. / Cunning, Steven J.; Rozenblit, Jerzy W.

In: Journal of Intelligent and Robotic Systems: Theory and Applications, Vol. 41, No. 2-3, 01.2005, p. 87-112.

Research output: Contribution to journalArticle

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