Bend loss effects in diffused, buried waveguides

James T.A. Carriere, Jesse A. Frantz, Brian R. West, Seppo Honkanen, Raymond K. Kostuk

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

Bend loss effects can be a significant concern in the design and performance of diffused, buried waveguide devices. Since diffused, buried waveguides typically do not have analytical mode solutions, the bend mode must be expressed as an expansion of straight waveguide modes. For the case of buried ion-exchanged waveguides, the bend loss is affected by bend radius, the duration of the ion exchange and burial processes, as well as the size of the mask opening used to create the waveguides and applied field during burial. The bend loss effects for each of these variables are explored under typical fabrication conditions.

Original languageEnglish (US)
Pages (from-to)1698-1703
Number of pages6
JournalApplied optics
Volume44
Issue number9
DOIs
StatePublished - Mar 20 2005

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ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

Cite this

Carriere, J. T. A., Frantz, J. A., West, B. R., Honkanen, S., & Kostuk, R. K. (2005). Bend loss effects in diffused, buried waveguides. Applied optics, 44(9), 1698-1703. https://doi.org/10.1364/AO.44.001698