A simple frequency-dependent ellipsometric technique for measuring the birefringence, the Pockels and Kerr properties of low glass-transition temperature photorefractive polymers is proposed. The technique is applied to the characterization of highly efficient DMNPAA:PVK:ECZ:TNF photorefractive polymers and the determination of the microscopic properties of the DMNPAA molecule.
|Original language||English (US)|
|Number of pages||1|
|Journal||Applied Physics Letters|
|State||Published - Dec 1 1995|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)