Bistable optical response in quantum well semiconductor microcavity

M. Gurioli, L. Cavigli, Galina Khitrova, H. M. Gibbs

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

We report an experimental study of the optical bistability in a semiconductor microcavity (MC), consisting of a wedged λ GaAs spacer containing a single 8.5 nm In0-04Ga0.96As quantum well (QW). Increasing the excitation power, a transition between the normal coupling and the weak coupling regime of the MC modes is observed. At intermediate excitation power the reflectivity spectrum shows the simultaneous presence of three resonances, with a third peak spectrally lying between the two normal modes. Monitoring the reflected signal for different laser energy as a function of the excitation power, we found that optical bistability is observed only at the energy of the third peak. The experimental findings do not agree with transfer matrix calculations based on exciton bleaching, suggesting that more complex nonlinear mechanisms are relevant in the observed bistable behaviour.

Original languageEnglish (US)
JournalSemiconductor Science and Technology
Volume19
Issue number4 SPEC. ISS.
DOIs
StatePublished - Apr 2004

Fingerprint

Optical bistability
Microcavities
Semiconductor quantum wells
optical bistability
quantum wells
Semiconductor materials
Bleaching
Laser modes
Excitons
excitation
bleaching
spacers
Lasers
Monitoring
excitons
reflectance
energy
lasers
LDS 751
gallium arsenide

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Bistable optical response in quantum well semiconductor microcavity. / Gurioli, M.; Cavigli, L.; Khitrova, Galina; Gibbs, H. M.

In: Semiconductor Science and Technology, Vol. 19, No. 4 SPEC. ISS., 04.2004.

Research output: Contribution to journalArticle

Gurioli, M. ; Cavigli, L. ; Khitrova, Galina ; Gibbs, H. M. / Bistable optical response in quantum well semiconductor microcavity. In: Semiconductor Science and Technology. 2004 ; Vol. 19, No. 4 SPEC. ISS.
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