Bit-level taint analysis

Babak Yadegari, Saumya K Debray

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

Taint analysis has a wide variety of applications in software analysis, making the precision of taint analysis an important consideration. Current taint analysis algorithms, including previous work on bit-precise taint analyses, suffer from shortcomings that can lead to significant loss of precision (under/over tainting) in some situations. This paper discusses these limitations of existing taint analysis algorithms, shows how they can lead to imprecise taint propagation, and proposes a generalization of current bit-level taint analysis techniques to address these problems and improve their precision. Experiments using a deobfuscation tool indicate that our enhanced taint analysis algorithm leads to significant improvements in the quality of deobfuscation.

Original languageEnglish (US)
Title of host publicationProceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages255-264
Number of pages10
ISBN (Print)9780769553047
DOIs
StatePublished - Dec 4 2014
Event14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014 - Victoria, Canada
Duration: Sep 28 2014Sep 29 2014

Other

Other14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014
CountryCanada
CityVictoria
Period9/28/149/29/14

Fingerprint

Experiments

Keywords

  • Program Understanding
  • Reverse Engineering
  • Taint Analysis

ASJC Scopus subject areas

  • Software
  • Computer Science Applications

Cite this

Yadegari, B., & Debray, S. K. (2014). Bit-level taint analysis. In Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014 (pp. 255-264). [6975659] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SCAM.2014.43

Bit-level taint analysis. / Yadegari, Babak; Debray, Saumya K.

Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 255-264 6975659.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yadegari, B & Debray, SK 2014, Bit-level taint analysis. in Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014., 6975659, Institute of Electrical and Electronics Engineers Inc., pp. 255-264, 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014, Victoria, Canada, 9/28/14. https://doi.org/10.1109/SCAM.2014.43
Yadegari B, Debray SK. Bit-level taint analysis. In Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 255-264. 6975659 https://doi.org/10.1109/SCAM.2014.43
Yadegari, Babak ; Debray, Saumya K. / Bit-level taint analysis. Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 255-264
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