Bit-level taint analysis

Babak Yadegari; Saumya Debray

doi:10.1109/SCAM.2014.43

Bit-level taint analysis

Babak Yadegari, Saumya Debray

Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

18 Scopus citations

Abstract

Taint analysis has a wide variety of applications in software analysis, making the precision of taint analysis an important consideration. Current taint analysis algorithms, including previous work on bit-precise taint analyses, suffer from shortcomings that can lead to significant loss of precision (under/over tainting) in some situations. This paper discusses these limitations of existing taint analysis algorithms, shows how they can lead to imprecise taint propagation, and proposes a generalization of current bit-level taint analysis techniques to address these problems and improve their precision. Experiments using a deobfuscation tool indicate that our enhanced taint analysis algorithm leads to significant improvements in the quality of deobfuscation.

Original language	English (US)
Title of host publication	Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	255-264
Number of pages	10
ISBN (Electronic)	9780769553047
DOIs	https://doi.org/10.1109/SCAM.2014.43
State	Published - Dec 4 2014
Event	14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014 - Victoria, Canada Duration: Sep 28 2014 → Sep 29 2014

Publication series

Name	Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014

Other

Other	14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014
Country	Canada
City	Victoria
Period	9/28/14 → 9/29/14

Keywords

Program Understanding
Reverse Engineering
Taint Analysis

ASJC Scopus subject areas

Software
Computer Science Applications

Access to Document

10.1109/SCAM.2014.43

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Yadegari, B., & Debray, S. (2014). Bit-level taint analysis. In Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014 (pp. 255-264). [6975659] (Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SCAM.2014.43

Bit-level taint analysis. / Yadegari, Babak; Debray, Saumya.

Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 255-264 6975659 (Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yadegari, B & Debray, S 2014, Bit-level taint analysis. in Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014., 6975659, Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014, Institute of Electrical and Electronics Engineers Inc., pp. 255-264, 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014, Victoria, Canada, 9/28/14. https://doi.org/10.1109/SCAM.2014.43

Yadegari B, Debray S. Bit-level taint analysis. In Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 255-264. 6975659. (Proceedings - 2014 14th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2014). https://doi.org/10.1109/SCAM.2014.43

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