Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

This paper compares four popular on-wafer calibration methods including Multiline TRL, LRRM, LRM, and SOLT, based on three diverse coplanar waveguide circuits. The results show that the Multiline TRL provides the highest accuracy and repeatability for all of the circuits up to 40GHz.

Original languageEnglish (US)
Title of host publicationIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
Pages315-318
Number of pages4
DOIs
StatePublished - Dec 1 2007
EventIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP - Atlanta, GA, United States
Duration: Oct 29 2007Oct 31 2007

Publication series

NameIEEE Topical Meeting on Electrical Performance of Electronic Packaging

Other

OtherIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
CountryUnited States
CityAtlanta, GA
Period10/29/0710/31/07

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures'. Together they form a unique fingerprint.

  • Cite this

    Li, Q., & Melde, K. L. (2007). Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures. In IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP (pp. 315-318). [4387190] (IEEE Topical Meeting on Electrical Performance of Electronic Packaging). https://doi.org/10.1109/EPEP.2007.4387190