Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

This paper compares four popular on-wafer calibration methods including Multiline TRL, LRRM, LRM, and SOLT, based on three diverse coplanar waveguide circuits. The results show that the Multiline TRL provides the highest accuracy and repeatability for all of the circuits up to 40GHz.

Original languageEnglish (US)
Title of host publicationIEEE Topical Meeting on Electrical Performance of Electronic Packaging
Pages315-318
Number of pages4
DOIs
StatePublished - 2007
EventIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP - Atlanta, GA, United States
Duration: Oct 29 2007Oct 31 2007

Other

OtherIEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
CountryUnited States
CityAtlanta, GA
Period10/29/0710/31/07

Fingerprint

Coplanar waveguides
Calibration
Networks (circuits)

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Li, Q., & Melde, K. L. (2007). Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures. In IEEE Topical Meeting on Electrical Performance of Electronic Packaging (pp. 315-318). [4387190] https://doi.org/10.1109/EPEP.2007.4387190

Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures. / Li, Qian; Melde, Kathleen L.

IEEE Topical Meeting on Electrical Performance of Electronic Packaging. 2007. p. 315-318 4387190.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Li, Q & Melde, KL 2007, Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures. in IEEE Topical Meeting on Electrical Performance of Electronic Packaging., 4387190, pp. 315-318, IEEE 16th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP, Atlanta, GA, United States, 10/29/07. https://doi.org/10.1109/EPEP.2007.4387190
Li Q, Melde KL. Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures. In IEEE Topical Meeting on Electrical Performance of Electronic Packaging. 2007. p. 315-318. 4387190 https://doi.org/10.1109/EPEP.2007.4387190
Li, Qian ; Melde, Kathleen L. / Broadband on-wafer calibrations comparison for accuracy and repeatability on co-planar waveguide structures. IEEE Topical Meeting on Electrical Performance of Electronic Packaging. 2007. pp. 315-318
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