Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction

G. E. Falkovich, Mikhail Stepanov, S. K. Turitsyn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In traditional optical soliton systems, arrival time jitter due the spontaneous emission noise and pulse-to-pulse interaction are two major factors limiting performance. As such, a theoretical method to calculate jitter statistics of interacting solitons is developed. Applying this approach, a non-Gaussian probability density function and calculated bit-error rate as a function of noise level, initial separation and phase difference between solitons is derived.

Original languageEnglish (US)
Title of host publicationConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Pages143-144
Number of pages2
Volume1
StatePublished - 2002
Externally publishedYes
Event2002 IEEE/LEOS Annual Meeting Conference Proceedings: 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society - Glasgow, United Kingdom
Duration: Nov 10 2002Nov 14 2002

Other

Other2002 IEEE/LEOS Annual Meeting Conference Proceedings: 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society
CountryUnited Kingdom
CityGlasgow
Period11/10/0211/14/02

Fingerprint

Solitons
Bit error rate
Statistics
Jitter
Degradation
Spontaneous emission
Probability density function

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering

Cite this

Falkovich, G. E., Stepanov, M., & Turitsyn, S. K. (2002). Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction. In Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS (Vol. 1, pp. 143-144)

Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction. / Falkovich, G. E.; Stepanov, Mikhail; Turitsyn, S. K.

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS. Vol. 1 2002. p. 143-144.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Falkovich, GE, Stepanov, M & Turitsyn, SK 2002, Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction. in Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS. vol. 1, pp. 143-144, 2002 IEEE/LEOS Annual Meeting Conference Proceedings: 15th Annual Meeting of the IEEE Lasers and Electro-Optics Society, Glasgow, United Kingdom, 11/10/02.
Falkovich GE, Stepanov M, Turitsyn SK. Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction. In Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS. Vol. 1. 2002. p. 143-144
Falkovich, G. E. ; Stepanov, Mikhail ; Turitsyn, S. K. / Calculation of non-Gaussian statistics and bit error rate degradation due to pulse-to-pulse interaction. Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS. Vol. 1 2002. pp. 143-144
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