Capturing device mismatch in analog and mixed-signal designs

Meiling Wang, Yu Cao, Min Chen, Jin Sun, Alex Mitev

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

As feature size goes below 70 nm, process variation introduced device mismatch may cause over 40% performance variations and circuit failures especially for analog/mixed-signal designs. The location dependent correlations among devices and the large number of devices in some practical designs make it difficult to predict performance corners accurately and efficiently. This paper aims to provide an overview of possible methodologies and approaches that model and analyze device mismatch. In particular, the paper describes a new finite point device modeling technique that can speed up the analysis procedure, a new parametric reduction method and a novel Chebyshev Affine Arithmetic (CAA) based performance bound estimation approach.

Original languageEnglish (US)
Pages (from-to)37-44
Number of pages8
JournalIEEE Circuits and Systems Magazine
Volume8
Issue number4
DOIs
StatePublished - Dec 2008

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Science Applications

Cite this

Capturing device mismatch in analog and mixed-signal designs. / Wang, Meiling; Cao, Yu; Chen, Min; Sun, Jin; Mitev, Alex.

In: IEEE Circuits and Systems Magazine, Vol. 8, No. 4, 12.2008, p. 37-44.

Research output: Contribution to journalArticle

Wang, Meiling ; Cao, Yu ; Chen, Min ; Sun, Jin ; Mitev, Alex. / Capturing device mismatch in analog and mixed-signal designs. In: IEEE Circuits and Systems Magazine. 2008 ; Vol. 8, No. 4. pp. 37-44.
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