Abstract
Several commercial CD-R and CD-RW optical recording disks are exposed to intense white light sources (Halogen Tungsten and High-Intensity Discharge) at different exposure times under three minutes. Main analog playback parameters for CD-R and CD-RW optical recording disks are identified and characterized. The contents of a test disk is recorded onto each CD-R and CD-RW disk using a commercial rewritable/recordable disk drive. For each disk, written marks are imaged under a Nomarsky/Bright field optical microscope before and after exposure. Using a dynamic tester carrier-to-noise ratio and timing jitter are determined before and after exposure. AZO-dye CD-R disks, cyanine-dye CD-R disks, and CD-RW disks show considerable reduction in written mark contrast after exposure. Pthalocyanine-dye CD-R disks do not show significant changes in the mark contrast after exposure. Dynamic tester results confirm the mark contrast results and give insight into playback behavior of exposed disks.
| Original language | English (US) |
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| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Publisher | Society of Photo-Optical Instrumentation Engineers |
| Pages | 84-92 |
| Number of pages | 9 |
| Volume | 3806 |
| Publication status | Published - 1999 |
| Event | Proceedings of the 1999 Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks - Denver, CO, USA Duration: Jul 21 1999 → Jul 22 1999 |
Other
| Other | Proceedings of the 1999 Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks |
|---|---|
| City | Denver, CO, USA |
| Period | 7/21/99 → 7/22/99 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics